A Time-of-Flight Mass Spectrometer with Broad Energy Focusing Reflector
A time-of-flight mass spectrometry and time-of-flight technology, which is applied in the field of mass spectrometry instruments, can solve the problems of increased time-of-flight difference, reduced resolution, and monotonous change of time-of-flight energy, and achieves the effect of small time-of-flight difference and high resolution.
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Embodiment 1
[0115] In this embodiment, for resolutions of 3000, 4000, 5000, 6000 and 7000, the ratio of the electric field length of each level of the reflector to the length of the free drift zone and the relative electric potential difference (V) of each level of the reflector are calculated using the above calculation method. The ratio of the lowest energy (eV) of the ion to be focused is shown in Table 1. In the calculation, the length and potential difference of the 15-order electric field are calculated, and the actual order can be selected according to the size of the energy range.
[0116] Table 1 For different resolutions, the relationship between the electric field length of each level of the wide energy focusing reflector and the length of the free drift zone
[0117] And the relationship between the electric field potential difference of each level and the minimum energy of the focused ion (unit: eV)
[0118]
[0119]
[0120]
[0121] Assuming that the ion energy range to be focuse...
Embodiment 2
[0126] Such as Picture 10 As shown, the second embodiment is different from the first embodiment in that the reflector only retains the first two grids, which can significantly improve the ion transmission efficiency, and the weak electric field penetration between subsequent electric fields can be compensated by fine-tuning the voltage. At this time, for the resolutions of 3000, 4000, 5000, 6000 and 7000, according to figure 1 , 2 The calculation process of and 3 can be calculated. The ratio of the electric field length of each level of the reflector to the length of the free drift zone and the ratio of the electric potential difference (V) of each level of the reflector to the lowest energy (eV) of the ion to be focused are shown in the table 3 shown. Due to the removal of some grids, there is a weak penetration between adjacent electric fields. Therefore, the calculated voltage is not the final voltage and needs to be fine-tuned to compensate for the influence of electric f...
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