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A Time-of-Flight Mass Spectrometer with Broad Energy Focusing Reflector

A time-of-flight mass spectrometry and time-of-flight technology, which is applied in the field of mass spectrometry instruments, can solve the problems of increased time-of-flight difference, reduced resolution, and monotonous change of time-of-flight energy, and achieves the effect of small time-of-flight difference and high resolution.

Active Publication Date: 2018-06-26
NORTHWEST INST OF NUCLEAR TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the time-of-flight varies monotonously with respect to energy before or after the central energy, the total time-of-flight difference will increase rapidly when the ion energy further deviates from the central energy, resulting in a rapid decrease in resolution

Method used

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  • A Time-of-Flight Mass Spectrometer with Broad Energy Focusing Reflector
  • A Time-of-Flight Mass Spectrometer with Broad Energy Focusing Reflector
  • A Time-of-Flight Mass Spectrometer with Broad Energy Focusing Reflector

Examples

Experimental program
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Embodiment 1

[0115] In this embodiment, for resolutions of 3000, 4000, 5000, 6000 and 7000, the ratio of the electric field length of each level of the reflector to the length of the free drift zone and the relative electric potential difference (V) of each level of the reflector are calculated using the above calculation method. The ratio of the lowest energy (eV) of the ion to be focused is shown in Table 1. In the calculation, the length and potential difference of the 15-order electric field are calculated, and the actual order can be selected according to the size of the energy range.

[0116] Table 1 For different resolutions, the relationship between the electric field length of each level of the wide energy focusing reflector and the length of the free drift zone

[0117] And the relationship between the electric field potential difference of each level and the minimum energy of the focused ion (unit: eV)

[0118]

[0119]

[0120]

[0121] Assuming that the ion energy range to be focuse...

Embodiment 2

[0126] Such as Picture 10 As shown, the second embodiment is different from the first embodiment in that the reflector only retains the first two grids, which can significantly improve the ion transmission efficiency, and the weak electric field penetration between subsequent electric fields can be compensated by fine-tuning the voltage. At this time, for the resolutions of 3000, 4000, 5000, 6000 and 7000, according to figure 1 , 2 The calculation process of and 3 can be calculated. The ratio of the electric field length of each level of the reflector to the length of the free drift zone and the ratio of the electric potential difference (V) of each level of the reflector to the lowest energy (eV) of the ion to be focused are shown in the table 3 shown. Due to the removal of some grids, there is a weak penetration between adjacent electric fields. Therefore, the calculated voltage is not the final voltage and needs to be fine-tuned to compensate for the influence of electric f...

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Abstract

The invention provides a wide energy focusing reflector design method for the time-of-flight mass spectrum. For ions in wide energy distribution, all-stage electric field dimensions of a reflector formed by multi-stage electric fields and voltages for loading by all polar plates are designed by using a numerical computation method, so that ion time-of-flight focusing can be realized and thus the resolution rate of the time-of-flight mass spectrum can be improved. The machining and assembly accuracy requirements are low by the reflector. For the reflector, a grid mesh between each two stages of electric fields can be avoided and only the first two stages of grid meshes are kept, so that the reflector can have high ion transport efficiency. And the influence caused by electric field leakage can be compensated by a fine tuning voltage.

Description

Technical field [0001] The invention belongs to the technical field of mass spectrometers, and can be applied to the design of reflective time-of-flight mass spectrometers, and in particular relates to a reflector in a time-of-flight mass spectrometer, which can realize time-of-flight focusing of ions with a wide energy distribution. Background technique [0002] The resolution of the time-of-flight mass spectrum is R=t / 2Δt, where t is the average time of ion flight, and Δt is the time difference of ion flight. The flight time difference of ions increases with the increase of the energy dispersion of the ion, so the energy dispersion of the ion is a main factor that affects the resolution of the time-of-flight mass spectrometer. [0003] The use of reflectors in the time-of-flight mass spectrometer can achieve energy time focusing, thereby improving the resolution of the time-of-flight mass spectrometer. At present, the design method of the reflector in the time-of-flight mass spe...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/40
CPCH01J49/406
Inventor 袁祥龙李志明翟利华韦冠一徐江沈小攀李静雅
Owner NORTHWEST INST OF NUCLEAR TECH
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