Miniature imaging type infrared temperature field measurement system

A technology of infrared temperature and measurement system, applied in measurement devices, optical radiation measurement, radiation pyrometry, etc., can solve the problems of poor dynamic response characteristics, mechanical movement mechanism, low reliability, etc., and achieve low anti-interference ability. Effect

Active Publication Date: 2017-05-17
BEIJING ZHENXING METROLOGY & TEST INST
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Problems solved by technology

[0004] However, the traditional multi-wavelength imaging temperature field measurement system adopts the scheme of placing filters of different central wavelengths in the optical system to obtain the infrared radiation of different wavelengths of the measured target, resulting in poor dynamic response characteristics and unable to measure the target temperature with drastic changes. Field, and there is a mechanical movement mechanism, the reliability is low

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  • Miniature imaging type infrared temperature field measurement system

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[0014] Embodiments of the present invention will be described below with reference to the drawings. Elements and features described in one drawing or one embodiment of the present invention may be combined with elements and features shown in one or more other drawings or embodiments. It should be noted that representation and description of components and processes that are not relevant to the present invention and known to those of ordinary skill in the art are omitted from the drawings and descriptions for the purpose of clarity.

[0015] refer to figure 1 , the present embodiment provides a micro-imaging infrared temperature field measurement system, including:

[0016] An infrared imaging module 102, configured to collect infrared radiation of the measured target 101;

[0017] N radiation homogenization units 103 are used to homogenize the infrared radiation, where N is an integer greater than or equal to 2;

[0018] N single-wavelength filter units 104 corresponding to...

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Abstract

The invention provides a miniature imaging type infrared temperature field measurement system, and the system comprises an infrared imaging module which is used for collecting infrared radiation of a measured object; N radiation homogenizing units which are used for the homogenizing of infrared radiation, wherein N is an integer greater than or equal to two; N single-wavelength filtering units which are corresponding to N radiation homogenizing units, wherein each single-wavelength filtering unit comprises M optical filters which are respectively used for obtaining the infrared radiation at different wavelengths, and M is the number of wavelengths; and an infrared detector which is used for detecting the infrared radiation at different wavelengths and outputting a measurement signal. The multi-wavelength radiation temperature measurement theory is applied to the system, thereby solving problems that a conventional miniature imaging type infrared temperature field measurement system is poor in anti-interference capability, and is poor in measurement precision.

Description

technical field [0001] The invention relates to the technical field of temperature field measurement, in particular to a miniature imaging infrared temperature field measurement system. Background technique [0002] At present, for the measurement of the temperature field, the imaging radiation temperature measurement method is mainly used. The use of area array infrared detectors for radiation temperature measurement has the advantages of fast response speed, good dynamic characteristics, and no theoretical upper limit of measurement. Today, imaging radiation temperature measurement technology is developing in the direction of miniaturization. The miniaturization of imaging radiation temperature measurement makes the infrared imaging device lightweight, small in size and low in power consumption; coupled with advanced high-precision infrared radiation temperature measurement technology, the miniaturized imaging radiation temperature measurement technology will be rapidly p...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/20
CPCG01J5/20G01J2005/0077G01J2005/202
Inventor 邱超孙红胜张玉国杜继东
Owner BEIJING ZHENXING METROLOGY & TEST INST
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