Distributed type X-ray diffraction measurement system

Abstract

The invention discloses a distributed type X-ray diffraction measurement system which comprises at least two X-ray diffractometers and a wireless intelligent terminal, wherein the wireless intelligent terminal is loaded with analysis processing software; each X-ray diffractometer and other X-ray diffractometers are independent from each other; the X-ray diffractometers are used for acquiring X-ray diffraction diagrams in local positions; the wireless intelligent terminal is used for processing data in a remote position via the analysis processing software; the X-ray diffractometers are connected with the wireless intelligent terminal via a conversion device; the conversion device is internally provided with a WIFI (Wireless Fidelity) modules and a main controller; the wireless intelligent terminal is internally provided with a wireless network card; the WIFI module is matched with the wireless network card; the WIFI module and the wireless network card are in point-to-point connection or the WIFI module is connected with a wireless local network into which the wireless network card is accessed; after being converted by the conversion device, the X-ray diffraction diagram acquired by using the X-ray diffractometers is transmitted to the wireless intelligent terminal. By adopting the distributed type X-ray diffraction measurement system, remote monitoring on the X-ray diffractometers is achieved for a first time, the experiment efficiency is improved, the experiment cost is lowered, a system is simplified, and the operation difficulties are alleviated.

Description

technical field [0001] The invention relates to the field of measuring equipment, in particular to a distributed X-ray diffraction measuring system. Background technique [0002] X-ray diffractometer is a large-scale physical testing and analysis instrument, which can carry out phase analysis. It is mainly composed of X-ray light source, diffraction signal detection system, data processing and printing map system and other parts. [0003] Existing X-ray diffractometers are usually equipped with a microcomputer-aided experiment system for data processing. The microcomputer-aided experiment system is generally connected by cables, and the cost of the equipment is high and it is not easy to carry. operate. Moreover, one microcomputer cannot control multiple X-ray diffractometers at the same time. For samples that need to be measured at the same time, multiple people must operate at the same time, requiring more experimenters, time-consuming and laborious, and the experiment ...

AI Technical Summary

Problems solved by technology

[0003] Existing X-ray diffractometers are usually equipped with a microcomputer-aided experiment system for data processing. The microcomputer-aided experiment system is generally connected by cables, and the cost of the equipment is high and it is not easy to carry. operate

Moreover, one microcomputer cannot control multiple X-ray diffractometers at the same time. For samples that need to be measured at the same time, multiple people must operate at the same time, requiring more experimenters, time-consuming and laborious, and the experiment efficiency is not high. Large investment in experimental equipment, high economic cost

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