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Memory apparatus

A memory and detection program technology, applied in static memory, instruments, etc., can solve the problems of waste of resources, unusable backup storage units, etc.

Active Publication Date: 2017-05-24
WINBOND ELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The remaining unused spare storage units will never be used, resulting in waste of resources

Method used

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Embodiment Construction

[0029] Please refer first figure 1 , figure 1 A schematic diagram of a memory device according to an embodiment of the present invention is shown. In this embodiment, the memory device 100 is, for example, a chip-type dynamic random access memory (Dynamic Random Access Memory, DRAM for short) or a Static Random Access Memory (SRAM for short) or other similar devices or The combination of these devices. The memory device 100 includes spare storage rows 110_1 to 110_3, spare state blocks 120_1 to 120_2, and a logical operation unit 130. The backup status blocks 120_1~120_2 can respectively correspond to the two first and second detection procedures used to detect the main storage row (not shown) of the memory device 100 during the test process, and provide the storage bytes as The storage space required for the first and second inspection procedures. In this embodiment, the first inspection procedure is, for example, a wafer probing procedure, and the second inspection procedur...

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Abstract

The invention provides a memory apparatus. The memory apparatus comprises a plurality of standby storage columns, a plurality of standby state blocks and a logic arithmetic unit. The standby state blocks correspond to a plurality of detection programs respectively. Each standby state block comprises a plurality of storage bytes. The storage bytes correspond to the standby storage columns respectively and are used for storing usage states of the corresponding standby storage columns generated by the corresponding detection programs. The logic arithmetic unit generates at least one mask signal according to the usage states of the corresponding standby storage columns generated by at least one relatively early first detection program in the detection programs. The mask signal is used for masking the usable standby storage columns in at least one relatively later second detection program in the detection programs. The memory apparatus can be provided with multiple memory repair mechanisms in different structural forms at the same time, so that the repair efficiency is improved.

Description

Technical field [0001] The present invention relates to a memory device, and more particularly to a memory device with damage repair function. Background technique [0002] With the increase in circuit complexity, various forms of memory devices are inevitably prone to produce defective or damaged memory elements in manufacturing. Therefore, in the case of a memory device on a wafer, during the test process, the chip probing (CP) after the wafer processing is completed, and the final test (FT) after the packaging is completed can be passed. , And in the system power up self test (System power up self test) to detect defective or damaged storage components. In addition, a spare storage element provided in the memory device can be used to replace defective or damaged storage elements to maintain the normal function of the memory device. Generally, when a spare storage element is used to perform the replacement action, it can often be accomplished by recording the data (for exampl...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/00G11C29/44
CPCG11C29/4401G11C29/785
Inventor 苏源茂赖志菁
Owner WINBOND ELECTRONICS CORP