Dynamic measurement system of digital speckle interference tiny in-plane deformation and measurement method

A technology of dynamic deformation and digital speckle, which is applied in the direction of measuring devices, instruments, and optical devices, can solve problems such as large measurement errors, cumbersome data processing, and complex measurement systems, so as to reduce costs, reduce calculations, and measure The effect of system simplification

Active Publication Date: 2017-05-31
HEFEI UNIV OF TECH
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Problems solved by technology

This method requires two laser light sources, the measurement system is complicated, and the subsequent data processing process is cumbersome, and it is easy to introduce large measurement errors

Method used

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  • Dynamic measurement system of digital speckle interference tiny in-plane deformation and measurement method
  • Dynamic measurement system of digital speckle interference tiny in-plane deformation and measurement method
  • Dynamic measurement system of digital speckle interference tiny in-plane deformation and measurement method

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Embodiment Construction

[0041] see figure 1In this embodiment, the micro dynamic deformation measurement system in the digital speckle interference surface uses the low-coherence laser 1 as the laser light source, and the laser light emitted by the low-coherence laser 1 is split into transmitted light and reflected light by the beam splitter 2; the transmitted light passes through the second A beam expander 3 expands the beam and illuminates the measured surface 6 as the first illumination light, and the reflected light sequentially passes through the first plane mirror 4 and the second beam expander 5 and then illuminates the measured surface 6 as the second illumination light; using speckle interference Technical measurement of in-plane deformation requires that the irradiation directions of the two illumination lights be symmetrical with respect to the center of the measured object, that is, the lighting part in the setup system needs to meet the following conditions: the center point of the measur...

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Abstract

The invention discloses a dynamic measurement system of digital speckle interference tiny in-plane deformation and a measurement method. The dynamic measurement system is characterized in that emergent light of a low-coherent laser device is divided into transmission light and reflection light through a light splitter; the transmission light is subjected to beam expansion and then irradiates a measured object surface; the reflection light passes through a plane mirror and a beam expanding mirror and then irradiates the measured object surface; diffuse reflection light of a measuring surface is divided into two beams of light through a light splitting prism; the two beams of light pass through the plane mirror, a diaphragm, an imaging lens and the light splitting prism respectively and then are imaged onto a CCD (Charge Coupled Device) camera. The dynamic measurement system disclosed by the invention can be used for carrying out dynamic measurement on the tiny in-plane deformation of a measured object and is a full-field, high-precision and easy-to-operate measurement system.

Description

technical field [0001] The invention relates to an in-plane micro dynamic deformation measurement system and measurement method based on digital speckle interference technology, which can extract the in-plane deformation from two adjacent speckle images, and is suitable for accurate in-plane deformation in complex environments. Measurement. Background technique [0002] Digital speckle interferometry is a full-field, non-contact, high-precision, high-sensitivity optical measurement technology that is widely used in nondestructive testing, mechanical parameter measurement, vibration measurement, and biomedical testing. [0003] In speckle interferometry, the deformation of the object causes the change of the speckle phase, so extracting the phase from the speckle interferogram is the key to obtain the measurement results. In order to obtain the interferometric phase accurately, a phase shift method is introduced. The main idea of ​​this method is to obtain the phase informa...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/16
CPCG01B11/162
Inventor 王永红高新亚但西佐孙方圆赵琪涵杨连祥
Owner HEFEI UNIV OF TECH
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