Detection method of linear grating ruler
A technology of linear grating and detection method, which is applied to measurement devices, optical devices, instruments, etc., can solve the problems of relying on manual point-finding measurement results and large influence, and achieve the effect of automatic detection, elimination of influence, and convenient detection.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
specific Embodiment approach 1
[0043] The detection method of the linear grating ruler is realized based on the detection device of the one-dimensional linear grating ruler;
[0044] like figure 1 As shown, the detection device of the one-dimensional linear grating ruler includes a base 1, a displacement reference mechanism, a displacement transmission mechanism and a three-optical axis laser interferometer 16;
[0045] The displacement reference mechanism includes a first clamping slider 2, a first clamping mechanism 3, a second clamping slider 7, a second clamping mechanism 6 and a slider guide seat 8;
[0046] The displacement transmission mechanism includes a motor 15, a ball screw 13, a ball guide seat 12, a ball slider 10, a grating reading head 5, and a bearing seat 9;
[0047] The slider guide seat 8 and the ball guide seat 12 are arranged on the base 1; axis parallel;
[0048] The first clamping slider 2 and the second clamping slider 7 are both arranged on the slider guide seat 8 and can move a...
specific Embodiment approach 2
[0071] Specific implementation mode 2: Combining figure 2 and image 3 Describe this embodiment,
[0072] In step 5 of this embodiment, for the i-th measurement point, the displacement values sαi' and sγi' measured by the three-axis laser interferometer are used to compensate sβi' to obtain s i ' The process includes the following steps:
[0073] For the i-th measurement point, the deflection angle is obtained from the distance D between the second beam 16b and the third beam 16c
[0074] Then, according to the distance D and the deflection angle θ, the displacement deviation e on the second beam 16b caused by the deflection is calculated, and then through the formula s i '=sβi'-e compensate sβi' to get s i '.
[0075] Other steps and parameters are the same as in the first embodiment.
specific Embodiment approach 3
[0077] In the fifth step of this embodiment, e=Dsinθ.
[0078] Other steps and parameters are the same as in the second embodiment.
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com