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Dualistic structure optical optimization method suitable to rapid three dimensional profilometry

A binary structure and three-dimensional shape technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of low three-dimensional measurement speed, color projection color aliasing, projection nonlinearity, etc., to avoid color aliasing , Reduce the measurement error and improve the measurement speed

Active Publication Date: 2017-06-13
浙江四点灵机器人股份有限公司
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Problems solved by technology

[0004] Although these methods can be used for 3D topography measurement, they cannot completely solve the following problems: 1) the projection nonlinear problem caused by multi-level gray values; 2) the color aliasing problem of color projection; 3) the adaptation of coding methods 4) The problem of low three-dimensional measurement speed

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  • Dualistic structure optical optimization method suitable to rapid three dimensional profilometry
  • Dualistic structure optical optimization method suitable to rapid three dimensional profilometry
  • Dualistic structure optical optimization method suitable to rapid three dimensional profilometry

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Embodiment Construction

[0034] The present invention will be further described below in conjunction with the accompanying drawings. The following examples are only used to illustrate the technical solution of the present invention more clearly, but not to limit the protection scope of the present invention.

[0035] Such as figure 1 It is a flowchart of a binary structured light optimization method suitable for fast three-dimensional shape measurement of the present invention. The present invention proposes a binary structured light optimization method suitable for rapid three-dimensional shape measurement, including the following steps: camera and projector λ correction; camera calibration, distortion correction; projecting phase-shifting grating stripes; projecting binary structured light encoding map ; The phase shift method is used to obtain the grating wrapping phase, and the grating order is obtained by using the coding stripes; the absolute phase is obtained to complete the phase unwrapping; ...

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Abstract

The invention discloses a dualistic structure optical optimization method suitable to rapid three dimensional profilometry. The method is characterized by comprising the steps of conducting inverted Y-shape correction to a camera and a projector, calibrating the camera, revising distortion, projecting phase shift grating fringe, projecting a dualistic structure optical coded graph, using the phase shift method to solve a grating wrapped phase, using the coded fringe to solve the grating orders, solving an absolute phase, completing the phase un-wrapping, mapping the phase to real heights to reconstruct a three dimensional profile. According to the dualistic structure optical optimization method suitable to rapid three dimensional profilometry, the optimized dualistic structure optical coding method is used for achieving the reconstruction of the three dimensional profile of an object. The method can be used for precisely determining a cycle order of the projection grating fringe, avoiding the non-linear projection problem of the multilevel gray value, and the color aliasing problem of multi-channel projection, the measuring speed is fast, and the method has a good adaptability to different measured objects, and a substantial and obvious technological effect.

Description

technical field [0001] The invention relates to a binary structured light optimization method suitable for fast three-dimensional shape measurement, and belongs to the technical field of fast three-dimensional shape measurement. Background technique [0002] The 3D imaging based on structured light projection can provide the three-dimensional contour information of the object. Through the decoding of the image and the phase unwrapping, the three-dimensional contour of the object surface can be accurately reconstructed. The structured light three-dimensional imaging is characterized by its large field of view, non-contact, and high precision. , real-time and other advantages, it has been widely used in the field of industrial three-dimensional measurement. [0003] Various phase shift methods, including three-step, four-step, and N-step phase shift methods, are used for three-dimensional reconstruction of objects. The more fringes projected by the phase shift method, the high...

Claims

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Application Information

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IPC IPC(8): G01B11/25G01B11/24
Inventor 林斌石磊
Owner 浙江四点灵机器人股份有限公司
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