Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Lossless screening method and device of irradiation-resistance performances of pulse width modulation devices

A technology of pulse width modulation and screening methods, which is applied in the direction of measuring devices, instruments, and measuring interference from external sources. The effect of irradiance

Inactive Publication Date: 2017-06-13
深圳市量为科技有限公司
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

That is, for the devices manufactured by the same process, the functional relationship between the information parameters and the radiation performance parameters is found out by conducting irradiation tests on a certain number of random samples, and then the screening of unirradiated devices is realized. However, in the prior art The regression analysis method ignores the relationship between irradiation and internal defects of PWM devices, resulting in inaccurate regression prediction equations, which ultimately affects the accuracy and reliability of pulse width modulator screening

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Lossless screening method and device of irradiation-resistance performances of pulse width modulation devices
  • Lossless screening method and device of irradiation-resistance performances of pulse width modulation devices
  • Lossless screening method and device of irradiation-resistance performances of pulse width modulation devices

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0034] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. The components of the embodiments of the present invention generally described and illustrated in the drawings herein may be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work shall fall within the protection scope of the present invention.

[0035] Th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a lossless screening method and device of irradiation-resistance performances of pulse width modulation devices. The method includes the steps that before a pulse width modulation device which serves as a random subsample is irradiated, a 15 Hz noise-point frequency value and an output duty ratio are obtained; an input sinking current is obtained after the pulse width modulation device which serves as the random subsample is irradiated; the output duty ratio and the 15 Hz noise-point frequency value serve as information parameters, the input sinking current serves as an irradiation performance parameter, multiple linear regression equations are established, and coefficient vectors in the multiple linear regression equations are calculated; on the basis of the coefficient vectors, and lossless-screening regression prediction equations between the information parameters and the irradiation performance parameter are established; the lossless-screening regression prediction equations are adopted to predict the irradiation-resistance performance of a single pulse width modulation device, and other pulse width modulation devices in the same batch are screened. According to the lossless screening method and device, on the premise that the pulse width modulation devices are lossless, the accurate and high-efficiency irradiation-resistance performance testing and screening are conducted on components and parts.

Description

Technical field [0001] The invention relates to the technical field of electronic appliances, and in particular to a method and device for non-destructive screening of the anti-radiation ability of a pulse width modulator. Background technique [0002] Pulse width modulator is an important part of modern switching power supply, pulse width modulator (PWM) used in space radiation environment, under the action of space charged particles and various rays, its performance will change significantly, including output pulse The absence, deformation, latch of the hour hand control and the transients of the control loop; therefore, how to test the anti-radiation ability of the pulse width modulator used in the space environment, and then screen out the pulse width with strong anti-radiation ability The use of the debugger is of great significance. [0003] In the prior art, there are two main methods for testing and screening the radiation resistance of pulse width modulators for aerospace...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/00
CPCG01R31/001
Inventor 石强李兆成
Owner 深圳市量为科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products