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Patterned substrate used for epitaxy and manufacturing method thereof

A patterned substrate and epitaxy technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve the problems of complex process, high hardware configuration cost, inability to realize large-area patterned substrates, etc., and achieve high efficiency Cost, low cost effect

Inactive Publication Date: 2017-06-16
SUZHOU NANOWIN SCI & TECH
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  • Claims
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Problems solved by technology

[0003] At present, the technology for preparing patterned substrates mainly adopts photolithography technology, which requires high hardware configuration costs, complex processes, and generally micron-sized masks. To achieve nanometer-scale masks, electron beam exposure is required. technology, which not only has high hardware configuration costs, but also cannot realize large-area patterned substrates

Method used

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  • Patterned substrate used for epitaxy and manufacturing method thereof
  • Patterned substrate used for epitaxy and manufacturing method thereof
  • Patterned substrate used for epitaxy and manufacturing method thereof

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Embodiment Construction

[0010] The specific implementation of the patterned substrate for epitaxy provided by the present invention and the manufacturing method thereof will be described in detail below in conjunction with the accompanying drawings.

[0011] attached figure 1 Shown is a schematic diagram of the implementation steps of the method provided by a specific embodiment of the present invention, including: step S10, providing a substrate, the surface of the substrate is a silicon carbide material; step S11, annealing the silicon carbide material to make Silicon is precipitated, so that a graphene film is obtained on the surface of the silicon carbide material; step S12, etching the graphene film, so that the graphene film forms a window at a position corresponding to the atomic step on the surface of the silicon carbide layer.

[0012] attached Figure 2A to attach Figure 2C Shown is the process flow diagram of the method provided by a specific embodiment of the invention.

[0013] attac...

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PUM

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Abstract

The invention provides a patterned substrate used for epitaxy. The patterned substrate comprises a silicon carbide layer. The surface of the silicon carbide layer is covered by a patterned graphene film. The position, which is corresponding to the surface atomic steps of the silicon carbide layer, of the graphene film is provided with a window. The invention also provides a manufacturing method of the patterned substrate used for epitaxy. The manufacturing method comprises the following steps that a substrate is provided, wherein the surface of the substrate is made of silicon carbide material; annealing is performed on the silicon carbide material so that silicon is enabled to be precipitated, and the graphene film is obtained on the surface of the silicon carbide material; and the graphene film is etched so that the position, which is corresponding to the surface atomic steps of the silicon carbide layer, of the graphene film is enabled to form the window.

Description

technical field [0001] The invention relates to the field of semiconductor materials, in particular to a patterned substrate for epitaxy and a manufacturing method thereof. Background technique [0002] Using a patterned substrate is a method used in epitaxial technology to improve the crystal quality of epitaxial thin films. Through the patterned mask technology, the dislocations under the mask can be blocked. At the same time, the epitaxial film grown in the window area bends and merges the dislocations through lateral growth, thereby reducing the dislocation density of the epitaxial film and improving the crystallinity of the epitaxial film. quality. The crystal quality of the thin film has a great relationship with the performance of the semiconductor device, therefore, the patterned substrate is of great significance to the preparation of the semiconductor thin film. [0003] At present, the technology for preparing patterned substrates mainly adopts photolithography ...

Claims

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Application Information

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IPC IPC(8): H01L21/20
CPCH01L21/0237H01L21/0243H01L21/02444H01L21/02499
Inventor 徐俞王建峰徐科
Owner SUZHOU NANOWIN SCI & TECH
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