Fault detection device and fault detection method for MRR fault in PNoC

A fault detection and fault technology, applied in the field of MRR fault detection devices in PNoC, can solve the problems of high temperature fluctuation sensitivity, MRR prone to faults, etc.

Active Publication Date: 2017-06-23
GUILIN UNIV OF ELECTRONIC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0003] Aiming at the problem that MRR in PNOC is prone to failure due to manufacturing defects and sensitivi

Method used

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  • Fault detection device and fault detection method for MRR fault in PNoC
  • Fault detection device and fault detection method for MRR fault in PNoC
  • Fault detection device and fault detection method for MRR fault in PNoC

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Embodiment Construction

[0026] A MRR fault detection device in a PNoC, such as figure 1 As shown, it is mainly composed of laser array, test vector generator, control vector generator, data coupler, MRR to be tested and square box.

[0027] All the MRRs to be tested are divided into two types, one type of MRR is the transmission MRR, and the other type of MRR is the reception MRR. In the preferred embodiment of the present invention, there are a total of 16 MRRs to be tested in the PNoC, and these 16 MRRs are divided into two categories, one category of 8 MRRs is used as the MRR sent by the IP core, and the other category of 8 MRRs is used by the IP core. The core is used as the receiving MRR.

[0028] The number of lasers included in the laser array is the same as the total number of MRRs to be measured in the PNoC. Each laser generates a laser light wave of one wavelength, and the wavelengths of the laser light waves generated by all lasers are different, and the entire laser array generates a wa...

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Abstract

The invention discloses a fault detection device and a fault detection method for an MRR (Micro Ring Resonator) fault in a PNoC (Photonic Network-on-Chip). In view of a fault caused by manufacturing defects and the sensitiveness of an MRR to great temperature fluctuation, a fault model is built, and a PNOC architecture composed of a laser array, a test vector generator, a control vector generator, a data coupler, an MRR under test and a square box is designed. The data coupler couples test data into an optical path. The on-off state of the MRR is controlled. Fault analysis and diagnosis are carried out based on collected test response.

Description

technical field [0001] The invention relates to the technical field of PNoC (Photonic Network-on-Chip, optical network-on-chip) testing, and in particular to a device and method for detecting MRR (MicroRingResonator, microring resonator) faults in PNoC. Background technique [0002] With the development of modern semiconductor manufacturing process and the application of nanotechnology, the number of IP cores on SoCs increases rapidly, and the communication bandwidth and power consumption between IP cores become new bottlenecks. In order to increase bandwidth and reduce power consumption, PNOC is the most promising alternative to traditional electrical NOC. Through high-speed switch MRR and low-power optical waveguide interconnection to achieve greater bandwidth and lower power consumption, PNOC is the trend and model of the next-generation network-on-chip interconnection. MRR is a key device in PNOC. However, due to manufacturing defects and MRR is highly sensitive to temp...

Claims

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Application Information

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IPC IPC(8): H04B10/077
CPCH04B10/0777
Inventor 朱爱军陈端勇胡聪许川佩
Owner GUILIN UNIV OF ELECTRONIC TECH
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