B-dot probe for vacuum diode electric current measurement

A technology of vacuum diode and current measurement, which is applied in the direction of measuring devices, only measuring current, measuring electrical variables, etc. It can solve the problems of vacuum sealing and fast leading edge signals, and achieve the effects of convenient parameter adjustment, reduced measurement error, and small elastic margin

Pending Publication Date: 2017-07-04
INST OF APPLIED ELECTRONICS CHINA ACAD OF ENG PHYSICS
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to accurately measure the current parameters of vacuum diodes, solve the problems of plasma shielding, vacuum sealing, and response to fast frontier signals at the same time, and ensure that the structure is compact, easy to implement, and easy to adjust parameters. B-dot probe for vacuum diode current measurement

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  • B-dot probe for vacuum diode electric current measurement

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Embodiment Construction

[0026] All the features disclosed in this specification, or all disclosed methods or steps in the process, except for mutually exclusive features and / or steps, can be combined in any manner.

[0027] Such as figure 1 The B-dot probe used for vacuum diode current measurement according to the present invention includes a cable holder, an O-shaped sealing ring, a grounding shell, a connecting rod, an induction coil, and a vacuum-sealed cable connector, a metal sealing ring, and a coil The skeleton and the insulating sheet, the cable seat, the vacuum sealed cable connector, the O-shaped sealing ring, the connecting rod, and the insulating sheet are all coaxial structures.

[0028] The coil bobbin is made of a dielectric material such as nylon and has a uniformly distributed external thread structure on the surface; the induction coil is uniformly wound by enameled wire along the thread groove of the coil bobbin, and the two ends of the enameled wire are twisted to form a twisted pair s...

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Abstract

The invention discloses a B-dot probe for vacuum diode electric current measurement. The B-dot probe comprises a cable seat, a grounded shell, a connecting rob, a vacuum cable connector and an insulating sheet, and the cable seat and the grounded shell are fixedly connected through a bolt as one; a through hole is arranged on the axis of the cable seat, the vacuum cable connector is arranged in the through hole, the insulating sheet is arranged in the grounded shell, the grounded shell is connected with the cable seat through a bolt, a induction coil is arranged between the insulating sheet and the cable seat, one end of the induction coil is connected with the vacuum cable connector, and the other end of the induction coil is connected with the cable seat. According to the invention, the B-dot probe has advantages of good design, simple and easily-realized structure, convenient operation and relatively low maintenance cost, the B-dot probe has highlighted substantive features and remarkable progress, and the B-dot probe is suitable to be widely popularized and applied in the field of vacuum diode electric current measurement.

Description

Technical field [0001] The invention relates to the technical field of pulse power, in particular to a B-dot probe used for vacuum diode current measurement. Background technique [0002] In the research of pulse power technology, vacuum diode is an important form of load, and accurate measurement of its voltage and current is an important means to reflect the operating status of the device. In the past work, the transmission line voltage and current parameters are often used to approximate the voltage and current parameters of the pulse power device, but the diode voltage and current parameters approximated in this way are not accurate. In order to improve the accuracy of the measurement, the measurement point should be set on the vacuum transmission section of the diode. At this time, the main technical difficulties are: one is to avoid the measurement error caused by the electron and plasma bombardment of the diode area, the second is to ensure the vacuum sealing of the measu...

Claims

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Application Information

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IPC IPC(8): G01R19/00
CPCG01R19/0092
Inventor 李春霞秦奋李文君徐莎王冬罗敏康强王淦平丁恩燕
Owner INST OF APPLIED ELECTRONICS CHINA ACAD OF ENG PHYSICS
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