Patents
Literature
Hiro is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Hiro

212 results about "Diode voltage" patented technology

The normal diode may have a reverse-breakdown voltage of around 160 volts (V), and this voltage is the common peak level of a 110 volts alternating current (VAC) power line voltage.

DC/DC converter

The invention relates to a DC / DC converter including an input to which an input voltage Vin is applied, a inductance L whose one terminal is connected to the input, a first controllable switch N1 via which the other terminal of the inductance is connectable to a reference potential Vss, a second controllable switch P1 via which the other terminal of the inductance is connectable to the output of the converter, and a regulator circuit 1 configured so that it is able to control the two switches in regulating the output voltage of the DC / DC converter to a predetermined wanted value. The second controllable switch is a PMOS-FET. The regulator circuit is configured so that when the input voltage is higher than the desired value of the output voltage, the gate of the PMOS-FET is permanently connected to a voltage which is larger than the difference between the input voltage and the threshold voltage of the PMOS-FET, it connecting the back gate of the PMOS-FET permanently to a voltage which is larger than the expression input voltage plus threshold voltage of the PMOS-FET minus the diode voltage of a pn junction of the PMOS-FET and timing the first controllable switch with a specific duty cycle so that the output voltage attains the wanted value. The converter in accordance with the invention now permits achieving both an increase and decrease in the input voltage. It can be put to use preferably in conjunction with battery-powered devices for which a wanted voltage is specified.
Owner:TEXAS INSTR INC

Direct-current tracing control high-power photovoltaic grid-connected inverter

The invention discloses a high-efficiency low-harmonic distortion rate high-power photovoltaic grid-connected inverter (100). The photovoltaic grid-connected inverter comprises a high frequency inverter (10), a series-connected resonance circuit (20), a fast incontrollable rectifier (30) and a power frequency inverter (40), wherein the high frequency inverter (10) is used for transforming the voltage of a photovoltaic array into impulse level; the series-connected resonance circuit (20) transforms the impulse level into sinusoidal voltage and current; the high frequency inverter (10) outputs a level impulse according to direct-current tracing control, so that the resonant amplitude of the series-connected resonance circuit (20) can be continuously adjusted, and traces the change of rectified grid voltage; the incontrollable rectifier (30) transforms the sinusoidal voltage with different amplitude values into direct-current voltage which traces the change of the rectified grid voltage;and the power frequency inverter (40) switches to trigger when the grid voltage crosses a zero point and is used for tracing the change of the grid voltage with output voltage. The inverter can be applied to the large-scale high voltage grid connection of photovoltaic electric power generating systems.
Owner:江苏博纬新能源科技有限公司

Proportional Settling Time Adjustment For Diode Voltage And Temperature Measurements Dependent On Forced Level Current

A temperature sensor circuit and system providing accurate digital temperature readings using a local or remote temperature diode. In one set of embodiments a change in diode junction voltage (ΔVBE) proportional to the temperature of the diode is captured and provided to an analog to digital converter (ADC), which may perform required signal conditioning functions on ΔVBE, and provide a digital output corresponding to the temperature of the diode. DC components of errors in the measured temperature that may result from EMI noise modulating the junction voltage (VBE) may be minimized through the use of a front-end sample-and-hold circuit coupled between the diode and the ADC, in combination with a shunt capacitor coupled across the diode junction. The sample-and-hold-circuit may sample VBE at a frequency that provides sufficient settling time for each VBE sample, and provide corresponding stable ΔVBE samples to the ADC at the ADC operating frequency. The ADC may therefore be operated at its preferred sampling frequency rate without incurring reading errors while still averaging out AC components of additional errors induced by sources other than EMI.
Owner:MICROCHIP TECH INC

Preparation method of diode chip on P+ substrate and structure of diode chip

The invention discloses a preparation method of a diode chip on a P+ substrate and a structure of the diode chip. The method comprises the following steps of: directly forming a P- epitaxial layer on the P+ substrate through epitaxy; forming a P+ well through filling boron; annealing a P well; forming an N- ring region through photoetching and etching; annealing the N- ring; forming an N+ main junction region through photoetching and etching; annealing the N+ main junction region; evaporating or sputtering A1 as a positive electrode and the like. In the structure, special structures of the P-epitaxial layer, the P+ well and an N- voltage dividing ring device, and an N+ arsenic filling process are adopted to ensure that the N+/P+ is broken down on a plane and to avoid lateral breakdown; the voltage of a diode formed on the P+ substrate is reduced to be lower than 5.1V, the lowest voltage can reach 2.0V, and leakage current is within 100uA, so that the uniformity of the voltage in the chip is ensured to be within 5%; and in fact the diode is a P-N junction formed by the P well and an N+ region. The structure is successfully applied to the fields of a low-voltage voltage-regulator diode and a low-voltage transient voltage suppressor diode.
Owner:CHENGDU SILAN SEMICON MFG

Method for testing thermal resistance of high-power silicon carbide diode

The invention relates to a method for testing thermal resistance of a high-power silicon carbide diode, which comprises the following steps: putting an insulation substrate with a device to be tested in a temperature-controlled cabinet, regulating the temperature of the temperature-controlled cabinet to 25 DEG C, applying a transient monopulse current to the diode, and testing the diode voltage drop corresponding to different pulse current magnitudes; heating the temperature-controlled cabinet to 125 DEG C, measuring the diode voltage drop corresponding to different pulse current magnitudes, comparing with the values measured at 25 DEG C, and taking a maximum current on the premise of ensuring obvious change of voltage drop; dropping the temperature of the temperature-controlled cabinet to 25 DEG C, applying a direct current with the magnitude selected above to the diode, and measuring the diode voltage drop after the junction temperature becomes stable; changing the temperature of the temperature-controlled cabinet, and testing the diode voltage drop at this time by using pulse current until the diode voltage drop at a certain temperature is equal to the diode voltage drop when applying the direct current, thus, the temperature of the temperature-controlled cabinet at this time is the equivalent junction temperature; and computing the thermal resistance of the diode according to the equivalent junction temperature by using a thermal resistance computing formula.
Owner:SOUTHEAST UNIV

Light emitting diode voltage adjusting device and driving system with same

The invention discloses a light emitting diode voltage adjusting device and a driving system with the same. The light emitting diode voltage adjusting device comprises a PI (proportional-integral) adjuster, an integrator, a subtractor, a comparer and an integrated circuit module, wherein the negative input end of the PI adjustor is connected with the negative end of a light emitting diode light bar so as to receive the voltage of the negative end of the light bar; the positive input end of the PI adjustor is used for receiving the reference voltage; the integrator is used for integrating output signals of the PI adjustor; the positive input end of the subtractor is used for receiving output signals of the PI adjustor; the negative input end of the subtractor is used for receiving the over-current protecting and detecting voltage which is obtained from a boost converter for driving the light bar, and subtracting the over-current protecting and detecting voltage from the output signals of the PI adjustor; the positive input end of the comparer is used for receiving output signals of the integrator; the negative input end of the comparer is used for receiving output signals of the subtractor; and the integrated circuit module is used for receiving output signals of the comparer and outputting control signals for controlling a switch transistor of the boost converter to be powered on or powered off based on received signals.
Owner:CHANGSHA HKC OPTOELECTRONICS CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products