The invention discloses an equal thickness interference method based centering error measuring device which comprises a laser device, a convergent mirror, a star tester, a spectroscope, a reference mirror, a receiving screen, a CCD (charge coupled device) detector, a computing group, a focusing group, a turning reflector, a measured lens, a connecting fixture and a precision rotating shaft. The convergent mirror, the star tester and the spectroscope are sequentially disposed on an optical axis of the laser device, the star tester is positioned on a focus of the convergent mirror, the reference mirror, the receiving screen and the CCD detector are sequentially disposed in an optical axis direction of a reference beam, the focusing group and the turning reflector are sequentially disposed on an optical axis of a measurement beam, the measured lens, the connecting fixture and the precision rotating shaft are sequentially disposed on an optical axis of the measurement beam turned by the turning reflector, and the measured lens is fixed on the precision rotating shaft through the connecting fixture. By the aid of the equal thickness interference principle, centering errors of the measured lens can be measured, and the equal thickness interference method based centering error measuring device can achieve whole-group measurement of a multi-lens group and is higher in precision than that of conventional visual microscopic measurement.