81 results about "Voltage islands" patented technology

An integrated circuit chip is provided which contains one or more processors and one or more cryptographic engines. A flow control circuit having a command processor accepts requests and data via a secure external interface through which only encrypted information is passed. The flow control circuit mediates decryption of this information using cryptographic keys that are present in hard coded form on the chip. In particular the flow control circuit includes a programmable hardware portion which is configurable in a secure manner to create a flexible internal chip architecture. The chip also includes a volatile memory disposed on a voltage island on which is maintained either through a battery backup or from a fixed power source (mains). The chip is thus enabled to securely perform cryptographic operations with the processors controlling the cryptographic engines through the flow control circuit.

Both logical and physical construction of voltage islands is disclosed. A semiconductor chip design is partitioned into "bins", which are areas of the design. In this way, a semiconductor chip design may be "sliced" into various areas and the areas may then be assigned to various voltage levels. Each bin may be thought of as a voltage island. Circuits in the design can be added to or removed from the various bins, thereby increasing or decreasing the speed and power of the circuits: the speed and power increase if a circuit is placed into a bin assigned a higher voltage, and the speed and power decrease if a circuit is placed into a bin having a lower voltage. The size and location of the bins may also be changed. By iterating these steps, the optimum power consumption may be met while still meeting speed constraints and other criteria. The present invention is applicable to any placement environment, such as an annealing placement tool, that proceeds through successive refinement of the locations of the circuits on the design and in which the placement process may be interrupted to make changes in placement of the logic.

Methods and apparatus are provided for varying one or more of a supply voltage and reference voltage in an integrated circuit, using independent control of a diode voltage in an asymmetrical double-gate device. An integrated circuit is provided that is controlled by one or more of a supply voltage and a reference voltage. The integrated circuit comprises an independently controlled asymmetrical double-gate device to adjust one or more of the supply voltage and the reference voltage. The independent control may comprise, for example, a back gate bias. The independently controlled asymmetrical double-gate device may be employed in a number of applications, including voltage islands, static RAM, and to improve the power and performance of a processing unit.

Voltage islands enable a core-level power optimization of ASIC / SoC designs by utilizing a unique supply voltage for each cluster of the design. Creating voltage islands in a chip design for optimizing the overall power consumption consists of generating voltage island partitions, assigning voltage levels and floorplanning. The generation of voltage island partitions and the voltage level assignment are performed simultaneously in a floorplanning context due to the physical constraints involved. This leads to a floorplanning formulation that differs from the conventional floorplanning for ASIC designs. Such a formulation of a physically aware voltage island partitioning and method for performing simultaneous voltage island partitioning, level assignment and floorplanning are described, as are the definition and the solution of floorplanning for voltage island based designs executed under area, power, timing and physical constraints. The physical planning of voltage islands includes: a) characterizing cell clusters in terms of voltages and power consumption values; b) providing a set of cell clusters that belong to a single voltage island Random Logic Macro (RLM); and c) assigning voltages for the voltage island RLMs, all within the context of generating a physically realizable floorplan for the design.

A level converter for interfacing two circuits supplied by different supply voltages, and integrated circuit including the level converter interfacing circuit in two different voltage islands. A first buffer is supplied by a virtual supply and receives an input signal from a lower voltage circuit. The first buffer drives a second buffer, which is supplied by a higher supply voltage. An output from the second buffer switches a supply select to selectively pass the higher supply voltage or a reduced supply voltage to the first buffer.

A method of analysis of an integrated circuit design having multiple voltage islands, including: (a) determining a clock path through the voltage islands; (b) determining a data path through the voltage islands; (c) determining which voltage islands are independent voltage islands; (d) determining which voltage islands are dependent voltage islands; (e) for the data path and the clock path, performing a worst case static timing analysis based on minimum and maximum operating voltages of each independent and dependent voltage island in the data and clock paths; and (f) for the data path and the clock path, performing a best case static timing analysis based on minimum and maximum operating voltages of each independent and dependent voltage island in the data and clock paths.

Both logical and physical construction of voltage islands is disclosed. A semiconductor chip design is partitioned into 'bins', which are areas of the design. In this way, a semiconductor chip design may be 'sliced' into various areas and the areas may then be assigned to various voltage levels. Each bin may be thought of as a voltage island. Circuits in the design can be added to or removed from the various bins, thereby increasing or decreasing the speed and power of the circuits: the speed and power increase if a circuit is placed into a bin assigned a higher voltage, and the speed and power decrease if a circuit is placed into a bin having a lower voltage. The size and location of the bins may also be changed. By iterating these steps, the optimum power consumption may be met while still meeting speed constraints and other criteria. The present invention is applicable to any placement environment, such as an annealing placement tool, that proceeds through successive refinement of the locations of the circuits on the design and in which the placement process may be interrupted to make changes in placement of the logic.

Voltage islands enable a core-level power optimization of ASIC / SoC designs by utilizing a unique supply voltage for each cluster of the design. Creating voltage islands in a chip design for optimizing the overall power consumption consists of generating voltage island partitions, assigning voltage levels and floorplanning. The generation of voltage island partitions and the voltage level assignment are performed simultaneously in a floorplanning context due to the physical constraints involved. This leads to a floorplanning formulation that differs from the conventional floorplanning for ASIC designs. Such a formulation of a physically aware voltage island partitioning and method for performing simultaneous voltage island partitioning, level assignment and floorplanning are described, as are the definition and the solution of floorplanning for voltage island based designs executed under area, power, timing and physical constraints. The physical planning of voltage islands includes: a) characterizing cell clusters in terms of voltages and power consumption values; b) providing a set of cell clusters that belong to a single voltage island Random Logic Macro (RLM); and c) assigning voltages for the voltage island RLMs, all within the context of generating a physically realizable floorplan for the design.

A solution for determining minimum operating voltages due to performance / power requirements would be valid for a wide range of actual uses. The solution includes a test flow methodology for dynamically reducing power consumption under applied conditions while maintaining application performance via a BIST circuit. There is additionally provided a test flow method for dynamically reducing power consumption to the lowest possible stand-by / very low power level under applied conditions that will still be sufficient to maintain data / state information. One possible application would be for controlling the voltage supply to a group of particular circuits on an ASIC (Application Specific Integrated Circuit). These circuits are grouped together in a voltage island where they would receive a voltage supply that can be different from the voltage supply other circuits on the same chip are receiving. The same solution could be applied to a portion of a microprocessor (the cache logic control, for example).

A method, apparatus and computer program product are provided for implementing RTL power sequencing simulation of voltage islands for application specific integrated circuit (ASIC) designs. RTL sequential state saving elements in a voltage island hierarchy are identified. A state is invalidated for each identified RTL sequential state saving element during a power down operation. Switch objects are used to identify and skip globally powered gate level circuits in the voltage island. RTL sequential state saving elements and VI switch objects can be identified using predefined reserved signal identifiers in the ASIC library.

A voltage island architecture wherein the source voltage of each voltage island can be independently turned on / off or adjusted during a scan-based test. The architecture includes a plurality of voltage islands (102, 104), each powered by a respective island source voltage (VDDI1, VDDI2), and a testing circuit (116), coupled to the voltage islands, and powered by a global source voltage (Vg) that is always on during test, wherein each island source voltage may be independently controlled (106, 108) during test.

A test circuit that compares test results between two tests with different local supply voltages is provided. The output of each stage of the logic circuits is stored in a first register of each test circuit. Each test is performed with a critical test vector and a local supply voltage that decreases from test to test. The outputs of successive tests are compared in each test circuit. The tests are performed iteratively with successive reduction in the value of the local supply voltage until at least one stage of the logic circuits produces non-matching results between the first and second register. The voltage immediately before producing such non-matching results is the minimum operational voltage for the local voltage island.

A system and method for eliminating step response power supply perturbation during voltage island power-up / power-down on an integrated circuit is disclosed. An IC chip communicates with a primary power supply and includes at least one voltage island. A primary header on the voltage island of the chip communicates with the primary power supply via a primary header power path. A secondary header on the voltage island of the chip communicates with a secondary power supply via a secondary header power path. A control decoder communicating with the IC chip and the voltage island regulates the state of the primary and secondary headers.

A method is provided for characterizing performance of a chip having at least one voltage island and at least one performance screen ring oscillator (PSRO). An on-chip performance monitor (OCPM) is incorporated on the voltage island. Performance measurements of the voltage island are generated with only the voltage island under power. Performance measurements of the performance screen ring oscillator (PSRO) are generated with only the voltage island under power. Performance measurements of the performance screen ring oscillator (PSRO) is compared to the performance measurements of the on-chip performance monitor (OCPM) to determine a systematic offset due to the voltage island. Performance models are adjusted using the systematic offset due to the voltage island.

Modular chip integration and operation techniques are provided. In one aspect, a method of integrating chips, chip macros or at least one chip in combination with at least one chip macro is provided. The method comprises the following steps. The chips, chip macros or at least one chip in combination with at least one chip macro are assembled on a single carrier platform. One or more signal inputs and outputs are provided to each of the chips, chip macros or at least one chip in combination with at least one chip macro. One or more power and ground inputs and outputs are provided to each of the chips, chip macros or at least one chip in combination with at least one chip macro. The power and ground inputs and outputs to one or more of the chips, chip macros or at least one chip in combination with at least one chip macro are segmented from the power and ground inputs and outputs to at least one other of the chips, chip macros or at least one chip in combination with at least one chip macro so as to form a plurality of voltage islands.

A method is provided for characterizing performance of a chip having at least one voltage island and at least one performance screen ring oscillator (PSRO). An on-chip performance monitor (OCPM) is incorporated on the voltage island. Performance measurements of the voltage island are generated with only the voltage island under power. Performance measurements of the performance screen ring oscillator (PSRO) are generated with only the voltage island under power. Performance measurements of the performance screen ring oscillator (PSRO) is compared to the performance measurements of the on-chip performance monitor (OCPM) to determine a systematic offset due to the voltage island. Performance models are adjusted using the systematic offset due to the voltage island.

An integrated circuit. The integrated circuit includes a parent terrain; and a hierarchical order of nested voltage islands within the parent terrain, each higher-order voltage island nested within a lower-order voltage island, each nested voltage island having the same hierarchical structure.