Digital antenna test system and method

Abstract

The invention discloses a digital antenna test system and method. The system comprises a digital antenna probe array, digital test equipment, a data bus and a center industrial control computer, wherein the digital test equipment is connected with a to-be-tested antenna structure, the digital antenna probe array is connected with the to-be-tested antenna structure through a space wireless channel, the to-be-tested antenna structure, the digital antenna probe array, the digital test equipment and the center industrial control computer are connected with the data bus, the digital antenna probe array comprises N digital antenna probes, and the N is a natural number not smaller than 2. As all the spatial domain radiation signals can be simultaneously acquired one time, a test speed is improved by N times; as the radiation signals in all directions are simultaneously acquired in real time, antenna test data including directional diagrams and polarized characteristics has higher authenticity.

Description

technical field [0001] The invention relates to the technical field of antenna testing engineering, in particular to a digital antenna testing system and testing method. Background technique [0002] The radiation / reception characteristic test of traditional wireless communication, radar and other antennas (antenna arrays, complete equipment) is stimulated by standard instruments (such as signal sources or network analyzers, etc.) and sent to the antenna under test. After the standard antenna is received, it is sent to a standard instrument (such as a spectrum analyzer, power meter, network analyzer, etc.) for testing through a radio frequency cable. The test parameters often need to be imported into a computer for subsequent processing and analysis before they can be obtained. Since the beginning of the new century, the radiation indicators of consumer wireless electronic products such as smartphones and wireless wearable devices have attracted the attention of governments ...

AI Technical Summary

Problems solved by technology

[0004] 1) The insertion loss of the required RF cable is large, and the test stability caused by long-term testing is poor, and regular calibration is required;

[0005] 2) During multi-probe testing, each channel needs to be calibrated for amplitude consistency, and the calibration complexity of this time- and temperature-related characteristic is extremely high;

[0006] 3) The traditional turntable / scanner is still a multi-probe spatial distribution method, and the motor drive and switch matrix / power distribution network required at the back end have a certain hardware complexity, especially for large-scale test systems;

[0007] 4) The traditional multi-probe test system or the turntable scanning test scheme cannot realize high-precision synchronous real-time test data collection, the test cycle is long, and the test repeatability is poor;

[0008] 5) Turntable / scanning frame test scheme, the test quiet zone is easily affected by the rotating mechanism, and the test repeatability is poor

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