Method to prevent persistent sparking during cold cathode x-ray source testing and burn-in

Abstract

The invention relates to the field of electron emission and provides an X-ray source device. The X-ray source device comprises a three-pole X-ray source, a vacuum cavity, a vacuum pump unit, a positive electrode high-voltage power supply, a gate high-voltage and pulse driving unit, a vacuum environment monitoring unit and a control platform, wherein the three-pole X-ray source is arranged in the vacuum cavity and comprises a negative electrode, a gate and a positive electrode, the positive electrode high-voltage power supply and the gate high-voltage and pulse driving unit are respectively connected to the positive electrode and the gate of the three-pole X-ray source by flanges of the vacuum cavity, the negative electrode of the three-pole X-ray source is connected with the ground, and the vacuum environment monitoring unit and the vacuum pump unit are connected to the vacuum cavity respectively by different flanges. By the device, automatic control on the process of negative electrode test and aging can be achieved, the negative electrode is prevented from being damaged due to continuous fire striking during the aging process of the negative electrode, and the device has relatively high practicability. The invention also provides a method for preventing continuous fire striking during the test and aging process of a cold-cathode X-ray source by employing the device.

Description

technical field [0001] The present invention generally relates to the field of electron emission, and more particularly relates to an X-ray source device and a method for preventing continuous sparking during testing and aging of a cold-cathode X-ray source. Background technique [0002] As one of the key core components of the computed tomography (CT) system, the X-ray source determines the imaging mode and imaging performance of the CT system to a certain extent. The traditional X-ray source uses a hot cathode as the electron source, generates an electron beam by thermionic emission, accelerates the bombardment of the anode target under the action of a strong electric field, and generates X-rays through the bremsstrahlung of the electrons. Due to high operating temperature and high power consumption, hot cathodes are not conducive to the miniaturization of the X-ray source and the integration of multiple cathodes in a single X-ray source. Moreover, the prolongation of the...

AI Technical Summary

Problems solved by technology

The existing cold cathode testing and aging devices are divided into two types, one is an open vacuum chamber, and a vacuum pump is added to maintain the vacuum environment, the cathode can be replaced, and the device can be reused; the other is directly packaged into a glass or ceramic bulb for testing. Test, the cathode is not replaceable, and the cathode cannot be reused after being damaged by ignition

[0003] In the prior art, the vacuum chamber of the first method is open. Although the cathode can be replaced, the degree of automatic control of the whole device is not high, and the damage caused by continuous ignition of the cathode cannot be effectively avoided.

The other one adopts the direct encapsulation method. Although the cost is lower than the first one, once the cathode is ignited and damaged during the test and aging process, the entire bulb will be scrapped.

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