Preparation method of electron backscatter diffraction sample with alloy strip thickness section

Abstract

The invention discloses a preparation method of an electron backscatter diffraction sample with an alloy strip thickness section. The preparation method comprises the following steps: clamping an extremely-thin metal strip obtained by quenching and melt-spinning between two rectangular conductive metal blocks with hardness being approximate to the hardness of a strip alloy in order to fix the two rectangular conductive metal blocks and the thin strip together; vertically placing an alloy thin strip which is already parallel to the conductive metal blocks in a hot mounting press with a thickness section facing downwards horizontally; then, mounting a sample in conductive mounting powder by a hot mounting method, performing coarse grinding on metallographic abrasive paper, and integrally mounting into a cylinder with a certain diameter and a certain height by the hot mounting method; and then, removing a surface stress layer by performing mechanical grinding polishing and vibration polishing to prepare the electron backscatter diffraction sample which has superior surface quality and is provided with a thin strip with a thickness section of dozens of micrometers. The prepared sample has the characteristics of high conductive performance and high calibration rate in electron backscatter diffraction.

Description

Technical field [0001] The invention relates to the technical field of microscopic analysis and characterization, in particular to a method for preparing an electron backscatter diffraction sample of the thickness section of an alloy ribbon. Background technique [0002] In recent years, Electron Back-scattering Patterns (EBSP) has made great progress in the analysis technology of crystal microdomain orientation and crystal structure, and has been widely used in the characterization of material microstructure and microtexture. This technique is also known as Electron Backscattered Diffraction (EBSD). The characteristic of electron backscatter diffraction is to perform diffraction with a spatial resolution of sub-micron order while retaining the conventional characteristics of scanning electron microscopes, which gives crystallographic data. It has become an effective analysis method in materials research. However, backscattered electrons are only generated in the depth range of ...

AI Technical Summary

Problems solved by technology

However, this method is only suitable for the preparation of thin-gauge samples and not for thickness sections. Generally, the thickness section of a sample contains all the orientation information of the sample, and this preparation method cannot be used for samples with a thickness of only tens of microns. However, it is difficult to obtain electron backscattered diffraction samples with excellent surface quality

Images