Stress sensor based electronic device functional profile feature point displacement field reconstruction method

Abstract

The invention discloses a stress sensor based electronic device functional profile feature point displacement field reconstruction method. The method includes: determining a structural parameter and a material attribute of an electronic device functional profile and distribution positions and the number of stress sensors; acquiring a stress value measured by functional profile stress sensors under the action of service loads; establishing a structural finite element model of a functional profile; performing modal analysis on the functional profile; acquiring a modal shape and a stress modal shape of the functional profile; extracting a stress modal shape matrix corresponding to position nodes of the stress sensors; calculating a generalized modal coordinate; extracting a modal shape matrix corresponding to feature points of the functional profile; and reconstructing displacement of the feature points of the functional profile. Based on a modal analysis theory, the method can use stress values measured by the few stress sensors to reconstruct a displacement field of the feature points of the electronic device functional profile in the condition of unknown structural load information, and can direct structural distortion compensation and electrical performance compensation of the electronic device functional profile.

Description

Technical field [0001] The invention belongs to the technical field of radar antennas, and in particular relates to a method for reconstructing the displacement field of the characteristic point of the functional shape of an electronic equipment based on a strain sensor. The invention can be used to reconstruct the displacement field of the characteristic points of the functional surface of the electronic equipment, and lay a foundation for the structural deformation compensation and the electrical performance compensation of the functional surface of the electronic equipment to ensure the service performance of the functional surface. Background technique [0002] The most significant feature of the functional profile of electronic equipment is the combination of electromechanics and electrical performance as the main performance of the entire functional profile of electronic equipment. The mechanical structure performance serves the electrical performance and is the carrier and ...

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Problems solved by technology

Although this method reconstructs the displacement field of the deformed surface, it needs to know the location of the excitation load, which limits the application of this method and is not very practical

(2) Ko displacement theory method, such as Yuan Shenfang, Yan Meijia, Zhang Jinjin, a deformation reconstruction method suitable for beam wings, used in Nanjing University of Aeronautics and Astronautics Journal, 2014, 46(6): 825-830 Ko displacement theory reconstructs the deformation of the beam wing structure, and verifies the feasibility and reliability of this method, but this method requires a large number of sensors under high reconstruction accuracy, and this method can only be used for simpler structure

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