Unlock instant, AI-driven research and patent intelligence for your innovation.

Methods and apparatus for calibrating for transconductance or gain over process or condition variations in differential circuits

A technique for differential circuits and calibration circuits, applied in the direction of improving amplifiers to reduce temperature/supply voltage variations, logic circuit coupling/interfaces using field effect transistors, gain control, etc.

Active Publication Date: 2017-09-26
QUALCOMM INC
View PDF19 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] One design challenge with differential circuits is operating these circuits with process or condition changes (such as changes in voltage and / or temperature; commonly PVT changes)

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Methods and apparatus for calibrating for transconductance or gain over process or condition variations in differential circuits
  • Methods and apparatus for calibrating for transconductance or gain over process or condition variations in differential circuits
  • Methods and apparatus for calibrating for transconductance or gain over process or condition variations in differential circuits

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] The detailed description, set forth below in conjunction with the accompanying figures, is intended as a description of various configurations and is not intended to show the only configurations in which the concepts described herein may be implemented. The detailed description includes specific details for the purpose of providing a thorough understanding of various concepts. It should be apparent, however, to one skilled in the art that these concepts may be practiced without these specific details. In some instances, well-known structures and components are shown in block diagram form in order to avoid obscuring the concepts.

[0017] The term "device" shall be construed to include any integrated circuit or system, or any portion of an integrated circuit or system (eg, a component, circuit, etc. residing within an integrated circuit or part of a system). The term "device" shall also be construed to include any intermediate product in which an integrated circuit or s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An apparatus is provided. The apparatus includes a calibration circuit configured to generate a reference signal and at least one differential circuit each being configured to operate at a calibrated transconductance over process or condition variations based on the reference signal. The calibration circuit may be configured to generate the reference signal independent of the at least one differential circuit. A method for operating at least one differential circuit is provided. The method includes generating a reference signal and operating the at least one differential circuit at a calibrated transconductance or gain over process or condition variations based on the reference signal. The reference signal may be generated independently of the at least one differential circuit.

Description

[0001] Cross References to Related Applications [0002] This application claims the benefit of U.S. Patent Application No. 14 / 595,106, entitled "METHODS AND APPARATUS FORCALIBRATING FOR TRANSCONDUCTANCE OR GAIN OVER PROCESS OR CONDITION VARIATIONSIN DIFFERENTIAL CIRCUITS," filed January 12, 2015, which is hereby incorporated by reference in its entirety It is expressly incorporated herein. technical field [0003] The present disclosure relates generally to electronic circuits, and in particular to apparatus and methods for calibrating the transconductance or gain of differential circuits. Background technique [0004] Differential logic families are gaining popularity in devices and processors used for wireless communications. Wireless devices such as tablet computers and cell phones can employ processors that take advantage of differential logic circuits for certain advantages. Examples of differential logic families may include common-mode logic (CML) and low-voltage ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H03F3/45H03K19/003H03K19/0185
CPCH03F3/45183H03F3/45197H03F3/4565H03F3/45766H03K19/00384H03K19/018528H03F2200/447H03F2200/543H03F2203/45456H03F2203/45048H03F2203/45101H03F2203/45116H03F2203/45244H03G1/0029H03G3/3036H03F1/30H03F3/45076
Inventor 李淼孙立朱志
Owner QUALCOMM INC