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A Fast Calculation Method of Probe Antenna Model Based on Curve Fitting

A curve fitting and fast calculation technology, applied in design optimization/simulation, CAD numerical modeling, special data processing applications, etc., can solve the problems of low model calculation efficiency and complex process, and achieve the effect of simple and easy calculation

Active Publication Date: 2020-07-03
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0028] However, the high-precision Yaghjian model needs to store the measurement data of the complex reflection coefficient that changes with the frequency in the calculation process, and solve the quadratic complex number equation. The process is complicated and the calculation efficiency of the model is low.

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  • A Fast Calculation Method of Probe Antenna Model Based on Curve Fitting
  • A Fast Calculation Method of Probe Antenna Model Based on Curve Fitting
  • A Fast Calculation Method of Probe Antenna Model Based on Curve Fitting

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Embodiment Construction

[0045] The basic idea of ​​the present invention is: first, according to the measured complex reflection coefficient of the probe antenna in a frequency band, calculate the C in the limited frequency point according to the Yaghjian method 0 parameter, and then use the curve fitting method to fit the relationship between the parameter and the operating frequency, and only need to calculate the curve while transforming the near and far fields, which can greatly reduce the computational complexity of the model.

[0046] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0047] Such as figure 2 As shown, a fast calculation method of the probe antenna model based on curve fitting, including steps:

[0048] aMeasuring the complex reflection coefficient Γ(f j ), where f j is the working frequency point;

[0049] b Calculate each operating frequency point f j Corresponding parameter C 0 The distribution o...

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Abstract

The invention discloses a fast calculation method of a probe antenna model based on curve fitting. The method firstly calculates the parameter C varying with frequency according to the size of the probe aperture and the complex reflection coefficient of the probe. 0 , and then according to C 0 and frequency distribution, using curve fitting to obtain the reflection parameter C 0 The fitting function of the relationship with the frequency, the fitting coefficient is stored as the probe parameter, and in the process of near and far field transformation, the fitting function can be used to calculate the C 0 , and then calculated according to the new Yaghjian model to obtain the H-plane pattern of the probe. In this method, the computational complexity of the probe pattern in the process of near-far field transformation is significantly lower than that of solving the quadratic complex equation, and it also avoids storing complex reflection coefficient data in the entire frequency band.

Description

technical field [0001] The invention relates to a fast calculation method of a probe antenna model based on curve fitting. Background technique [0002] Since the invention of the antenna, its application in the defense industry and civilian fields such as radar, countermeasures, communication and navigation has been increasing day by day, and it has become an indispensable part of wireless equipment. Antenna measurement comes along with antenna design, and is an important means to guide antenna design and verify antenna performance. For antennas, the radiation and reception of signals is its core value, so the antenna pattern characteristics are also its core indicators. In order to meet the requirements of antenna pattern characteristic test, antenna automatic test system also emerges at the historic moment, and gradually develops along with the development of antenna design and manufacturing technology. [0003] With the advancement of computer technology and the develo...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20G06F111/10
CPCG06F30/20G06F2111/10
Inventor 杜刘革周扬赵锐常庆功王亚海
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP