Method for measuring average reflection step length of light in detector

An average reflection and detector technology, which is applied in the direction of photometry, measurement device, and scattering characteristic measurement using electrical radiation detectors. It can solve problems such as complex methods, achieve simple operation, strong in-depth development and application value, and high precision. Effect

Active Publication Date: 2017-11-24
INST OF HIGH ENERGY PHYSICS CHINESE ACADEMY OF SCI
View PDF4 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Moreover, the angular distribution of reflected light intensity depends on the wavelength of light and the incident angle as wel...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for measuring average reflection step length of light in detector
  • Method for measuring average reflection step length of light in detector
  • Method for measuring average reflection step length of light in detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] The present invention will be described in further detail below in conjunction with specific simulation verification and experimental suggestions and the accompanying drawings. The method flow of the present invention is as follows figure 1 Shown.

[0034] Experimental suggestion: Make a cylindrical shell with a diameter of 90cm and a height of 88cm. The inner side wall and upper and lower bottom covers of the cylindrical shell are covered with Tyvek material, and the inside is a medium with an attenuation length of more than 30 meters. Open a small circular opening with a diameter of 1.5cm on Tyvek, and place a photomultiplier tube on the small opening to align the photocathode with the small opening to receive the photons in the detector. A single-color LED light source is placed in the detector, and a pulse with a time width of 10 ns and a frequency not greater than 1 KHz is used to drive the light source to emit light.

[0035] Each photon emitted by the light source i...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
The inside diameter ofaaaaaaaaaa
Heightaaaaaaaaaa
Login to view more

Abstract

The invention discloses a method for measuring the average reflection step length of light in a detector. The method comprises: 1) filling a selected detector with a medium to be detected, and arranging a photomultiplier tube, wherein the inner wall of the detector is a high reflection material using diffuse reflection as the main; 2) irradiating in the detector by using a selected light source, and collecting light signals with the photomultiplier tubes; 3) changing the reflection area of the inner wall of the detector, repeatedly performing the step 2), and fitting according to the collected light signals to obtain the effective attenuation lengths [lambda]' of photons in the detector under different reflection areas; and 4) according to the data obtained in the step 3), fitting the point corresponding to the ratio r of the reflection area to the detector inner wall area by using a formula 1/[lambda]'=(1/[lambda])-ln(f)/L-ln(r)/L, and measuring the average reflection step length L of the light in the detector filled with the medium to be detected through fitting. According to the present invention, the method has advantages of simple operation, low error, high precision, novel principle, and strong deep development and application value.

Description

Technical field [0001] The invention relates to a method for measuring the average reflection step length of light in a detector by measuring the photon number attenuation; the photon number attenuation factor varies with the area of ​​the reflective material in a cylindrical detector whose inner wall is diffuse reflection as the main high-reflection material A simple new method is used to measure the average reflection step length of light in the detector. Background technique [0002] Tyvek is a diffuse reflection-based highly reflective material produced by DuPont in the United States. It is widely used as detector reflective materials and packaging materials. More than 85% of the reflected light of Tyvek (1082D) is diffuse reflection, and the rest is diffuse specular reflection. The reflectivity of Tyvek to light in the air can reach more than 90%, and the reflectivity of Tyvek in water is generally higher. [0003] Cylindrical detectors with highly reflective Tyvek on the in...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N21/47G01J1/42
CPCG01J1/42G01N21/4738
Inventor 李秀荣肖刚左雄冯少辉李骢王玲玉程宁
Owner INST OF HIGH ENERGY PHYSICS CHINESE ACADEMY OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap