Unlock instant, AI-driven research and patent intelligence for your innovation.

Film thickness monitor and evaporation machine

The technology of a monitor and an evaporation machine is applied in the directions of vacuum evaporation coating, sputtering coating, ion implantation coating, etc., which can solve the problem of reducing OLED production efficiency, short service life of film thickness monitoring sensor, and reducing OLED evaporation coating machine. Problems such as utilization rate and production capacity, to achieve the effect of improving utilization rate and production capacity, reducing the number of times, and prolonging the service life

Active Publication Date: 2019-10-11
WUHAN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Once the film thickness on the surface of the film thickness monitoring sensor at the window reaches a certain level, the film thickness monitoring sensor has reached its service life and cannot continue to work. Therefore, it is necessary to turn the turntable to move other film thickness monitoring sensors to the window to continue work, when all the film thickness monitoring sensors on the turntable have reached the end of their service life, it is necessary to open the cavity of the OLED evaporation machine and replace all the film thickness monitoring sensors in the film thickness monitor. , the high frequency of use of the OLED evaporation machine makes the service life of the film thickness monitoring sensor short, so it is necessary to frequently open the cavity of the OLED evaporation machine, thereby reducing the utilization rate and production capacity of the OLED evaporation machine, thereby reducing OLED production efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Film thickness monitor and evaporation machine
  • Film thickness monitor and evaporation machine
  • Film thickness monitor and evaporation machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] In order to further illustrate the technical means adopted by the present invention and its effects, the following describes in detail in conjunction with preferred embodiments of the present invention and accompanying drawings.

[0029] see Figure 1 to Figure 3 , the present invention provides a film thickness monitor 10, comprising: a housing 11, a turntable 12 disposed in the housing 11, several membranes disposed in the housing 11 and fixed on the turntable 12 The thickness monitoring sensor 13, the window 14 arranged on the housing 11, and the fan 15 installed on the window 14, when the turntable 12 rotates, drive the several film thickness monitoring sensors 13 to pass through the window in turn 14.

[0030] Specifically, the several film thickness monitoring sensors 13 are located on the same circle with the center of the turntable 12 as the center.

[0031] When the film thickness monitor 10 is in use, a film thickness monitoring sensor 13 is located at the w...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a film thickness monitor and a thermal evaporator. The film thickness monitor comprises a housing, a rotating disk disposed in the housing, a plurality of film thickness monitoring sensors which are disposed in the housing and are fixed to the rotating disk, a window disposed in the housing, and a fan disposed in the window. The rotating disk rotates, driving the plurality of film thickness monitoring sensors to pass the window in order. With the installation of the fan in the window of the housing, the organic micromolecule material volatilized to the window during theprocess of evaporation will be reduced, and the film thickness deposited on the surface of the film thickness monitoring sensor can be decreased, the service lifetime of the film thickness monitoringsensor will be prolonged, and the opening times of the cavity body of the thermal evaporator will be reduced, and the operation ratio and production power of the thermal evaporator will be improved. The thermal evaporator is advantageous in that with the installation of the film thickness monitor, the opening times of the cavity body of the thermal evaporator will be reduced, and the operation ratio and production power of the thermal evaporator will be improved.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a film thickness monitor and an evaporation machine. Background technique [0002] Organic light-emitting diode (Organic Light-Emitting Diode, OLED) display, also known as organic electroluminescent display, is a new type of flat panel display device, due to its simple preparation process, low cost, low power consumption, high luminance, Wide range of working temperature, light and thin size, fast response speed, easy to realize color display and large-screen display, easy to realize matching with integrated circuit driver, easy to realize flexible display, etc., so it has broad application prospects. [0003] According to the driving method, OLED can be divided into two categories: passive matrix OLED (Passive Matrix OLED, PMOLED) and active matrix OLED (Active Matrix OLED, AMOLED), namely direct addressing and thin film transistor (TFT, Thin Film Transistor) There are two typ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L51/56H01L21/67C23C14/24C23C14/12
Inventor 金贤权
Owner WUHAN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD