Power supply switching control device for single particle irradiation test on accelerator-simulated source

Abstract

The present invention discloses a power supply switching control device for a single particle irradiation test on an accelerator-simulated source. The device comprises a power supply switching controlcircuit board, an upper computer PC and a remote control computer PC. The power supply switching control circuit board and the upper computer PC are respectively connected with a program-control direct-current power supply. The power supply switching control circuit board provides a lower computer communication interface connection cable to be connected with the upper computer PC. The upper computer PC and the remote control computer PC are connected through a direct connection network cable. The power supply switching control circuit board and the program-control direct-current power supplyare arranged in an irradiation chamber. Through the remote control computer PC, the control operation of the power supply switching control circuit board and the program-control direct-current power supply is realized. The device is high in monitoring accuracy, and the manual control of the direct-current power supply during the test process is not required. The automatic switching of program-controlled voltage is realized and the working current of the circuit test board is automatically recorded. A plurality of different test circuits can be tested in sequence, and the efficiency of the single particle irradiation test on the accelerator-simulated source is improved.

Description

technical field [0001] The invention belongs to the technical field of research on a single-event effect ground simulation test platform, and in particular relates to a power switching control device for an accelerator simulation source single-particle irradiation test. Background technique [0002] All integrated circuits used in spacecraft electronic systems will be affected by the radiation of high-energy particles in space, resulting in single event effects, which may lead to functional failure of the circuit and bring fatal effects to the spacecraft. Therefore, how to improve the ability of aerospace-grade integrated circuits to resist single event effects has always been a research hotspot in the field of radiation hardening. [0003] The test methods of single event effect research are divided into two ways: space-borne flight test research and ground simulation test. Although the space flight test is the most direct way to study single event effects, it has a long d...

AI Technical Summary

Problems solved by technology

In this long cable power supply mode, the voltage drop of the cable is large, which may easily cause insufficient power supply to the test circuit board; and because the parasitic capacitance is too large, the current change recorded in the monitoring room is difficult to accurately compare with the current change on the circuit test board. Corresponding, resulting in unreliable test results

When testing multiple different circuits, it is necessary to switch the power supply to the circuit. At this time, the output voltage of the DC power supply can only be adjusted on the spot, and the current limit range can be set, which wastes precious heavy ion accelerator machines, and the test efficiency is low.

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