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Test case generation method, terminal and storage medium

A test case generation and test case technology, applied in software testing/debugging, error detection/correction, instruments, etc., can solve the problems of unable to write test cases and difficult to locate

Active Publication Date: 2021-09-07
TCL OVERSEAS ELECTRONIC (HUIZHOU) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The main purpose of the present invention is to provide a test case generation method, terminal and storage medium, aiming to solve the above-mentioned technical problem that it is difficult to locate and write corresponding test cases

Method used

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  • Test case generation method, terminal and storage medium
  • Test case generation method, terminal and storage medium
  • Test case generation method, terminal and storage medium

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Embodiment Construction

[0038] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0039] refer to figure 1 , figure 1 It is a schematic diagram of the terminal structure of the hardware operating environment involved in the solution of the embodiment of the present invention.

[0040] Such as figure 1 As shown, the terminal may include: a processor 1001 , such as a CPU, a communication bus 1002 , a user interface 1003 , a network interface 1004 , and a memory 1005 . Wherein, the communication bus 1002 is used to realize connection and communication between these components. The user interface 1003 may include a display screen (Display), an input unit such as a keyboard (Keyboard), and the optional user interface 1003 may also include a standard wired interface and a wireless interface. Optionally, the network interface 1004 may include a standard wired interface and a wireless interface (such a...

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PUM

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Abstract

The invention discloses a method for generating a test case, a terminal and a storage medium. The method includes: obtaining the historical operation record of the target device and the first time stamp when an abnormality occurs; A target historical operation before a time stamp and closest to the first time stamp; determining a starting point of a test case according to the target historical operation, and generating a test case according to the determined starting point. The present invention finds the target historical operation from the historical operation records, determines the starting point of the test case according to the target historical operation, accurately locates the problem, thereby generates a test case to solve the problem, and avoids the problem from entering the market because it is difficult to locate and cannot be further solved. Improve product quality and enhance user experience.

Description

technical field [0001] The invention relates to the field of automated testing, in particular to a method for generating test cases, a terminal and a storage medium. Background technique [0002] Domestic labor costs are getting higher and higher, and there is an urgent need to use automated testing to reduce testing manpower. The factory is undergoing industrial transformation and needs to use automation technology to improve testing efficiency and ensure product quality. Now the operating system has a log system, and various abnormal states can be seen in the log system. Software developers, according to these logs, it is difficult to locate the problem, and often need the help of testers to reproduce the problem, and many problems are sporadic and difficult to reproduce. Because it is difficult to reproduce, these problems will flow to the market and eventually be complained by users. Existing automated test cases are written manually based entirely on the experience o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
CPCG06F11/3636G06F11/3684
Inventor 康德恩何方梁玮
Owner TCL OVERSEAS ELECTRONIC (HUIZHOU) CO LTD