Large-scale high-temperature test equipment applied to reliability test of solid-state disk

A technology of test equipment and solid-state hard disk, which is applied in the direction of temperature control, static memory, and instruments using electric methods, which can solve the problems of test board charging, test board loss, heat loss, etc., and achieve high precision, accurate temperature control, and prevent The effect of heat loss

Pending Publication Date: 2018-02-09
SHENZHEN SHICHUANGYI ELECTRONICS
View PDF0 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1. The insulation performance of the equipment is poor, and the circuit settings of the traditional aging equipment and the frame are unreasonable. When the product is unqualified for aging, it is necessary to open the door from time to time, causing serious temperature loss in the aging room;
[0005] 2. The temperature control performance of the traditional aging room is poor, there is no air circulation system, and the temperature emitted by the heating wire directly acts on the aging room, which makes the temperature of the aging room unbalanced and easily leads to product damage
[0006] 3. The control of the heating wire is unreasonable. The heating wire in the traditional aging room is also controlled by temperature. If the temperature is too high, stop heating. If the temperature is too low, continue to energize and heat. Turn off, this will cause the heating wire to work unstable, and the heat is not easy to control;
[0007] 4. The traditional product test frame is also unreasonable. The traditional test frame is connected to the power supply as a whole, and the test boards of the entire frame body work or close at the same time. Unqualified products need to be removed in time, which results in problems as described in defect 1. The heat is dissipated, and the test board is charged and powered off, making the entire circuit unstable
[0008] 5. The power connection of traditional equipment is an integrated connection, and the power supply system of the product is an integral power supply. If some shelves are not in use, they are also in the power supply state. Therefore, serious losses are caused to the test board

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Large-scale high-temperature test equipment applied to reliability test of solid-state disk
  • Large-scale high-temperature test equipment applied to reliability test of solid-state disk
  • Large-scale high-temperature test equipment applied to reliability test of solid-state disk

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0052]The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0053] Please refer to the attached Figure 1-12 , a kind of large-scale high-temperature test equipment applied to the reliability test of solid-state hard disk of the present invention, this large-scale high-temperature test equipment comprises equipment casing 1, and described equipment casing 1 is provided with a plurality of independent burn-in chambers 101, in each equipment casing 1 The shell is equipped with air circulation system, temperature control system, over-temperature protection system and product power supply system;

[0054] A heat insulating layer 113 is arranged in the shell of the device, and an air channel plate 109 is arrang...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a large-scale high-temperature test equipment applied to reliability testing of solid-state hard disks. The large-scale high-temperature test equipment includes a device shell, and the equipment shell is provided with a plurality of independent aging chambers. Equipped with air circulation system, temperature control system, over-temperature protection system, and product power supply system; the invention is energy-saving and environmentally friendly, and each high-temperature chamber can be independently controlled by a power supply, and the rational use of each aging chamber can be individually controlled to minimize frequent shutdowns of equipment Compared with other equipment with the same production capacity, it can save at least 40% of power consumption when starting up, heating and cooling. The product test frame adopts a cart-type aging frame, which is designed in a cart-type manner. Universal wheels are installed at the bottom of the frame body, which can be easily pushed and pulled during use.

Description

technical field [0001] The invention relates to high-temperature aging equipment, in particular to a large-scale high-temperature testing equipment used in reliability testing of solid-state hard disks. Background technique [0002] As we all know, the high-temperature aging room is a high-temperature and harsh environment test equipment for high-performance electronic products. It is an important experimental equipment to improve product stability and reliability, and an important production process for various manufacturers to improve product quality and competitiveness. , The device is widely used in power electronics, computers, communications, biopharmaceuticals and other fields. [0003] Traditional aging equipment has several disadvantages: [0004] 1. The insulation performance of the equipment is poor, and the circuit settings of the traditional aging equipment and the frame are unreasonable. When the product is unqualified for aging, it is necessary to open the do...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56G05D23/19
CPCG11C29/56G05D23/19G11C29/56016
Inventor 倪黄忠
Owner SHENZHEN SHICHUANGYI ELECTRONICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products