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Large-scale high-temperature test equipment applied to reliability test of solid-state disk

A technology of test equipment and solid-state hard disk, which is applied in the direction of temperature control, static memory, and instruments using electric methods, which can solve the problems of test board charging, test board loss, heat loss, etc., and achieve high precision, accurate temperature control, and prevent The effect of heat loss

Pending Publication Date: 2018-02-09
SHENZHEN SHICHUANGYI ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1. The insulation performance of the equipment is poor, and the circuit settings of the traditional aging equipment and the frame are unreasonable. When the product is unqualified for aging, it is necessary to open the door from time to time, causing serious temperature loss in the aging room;
[0005] 2. The temperature control performance of the traditional aging room is poor, there is no air circulation system, and the temperature emitted by the heating wire directly acts on the aging room, which makes the temperature of the aging room unbalanced and easily leads to product damage
[0006] 3. The control of the heating wire is unreasonable. The heating wire in the traditional aging room is also controlled by temperature. If the temperature is too high, stop heating. If the temperature is too low, continue to energize and heat. Turn off, this will cause the heating wire to work unstable, and the heat is not easy to control;
[0007] 4. The traditional product test frame is also unreasonable. The traditional test frame is connected to the power supply as a whole, and the test boards of the entire frame body work or close at the same time. Unqualified products need to be removed in time, which results in problems as described in defect 1. The heat is dissipated, and the test board is charged and powered off, making the entire circuit unstable
[0008] 5. The power connection of traditional equipment is an integrated connection, and the power supply system of the product is an integral power supply. If some shelves are not in use, they are also in the power supply state. Therefore, serious losses are caused to the test board

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  • Large-scale high-temperature test equipment applied to reliability test of solid-state disk
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  • Large-scale high-temperature test equipment applied to reliability test of solid-state disk

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Embodiment Construction

[0052]The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0053] Please refer to the attached Figure 1-12 , a kind of large-scale high-temperature test equipment applied to the reliability test of solid-state hard disk of the present invention, this large-scale high-temperature test equipment comprises equipment casing 1, and described equipment casing 1 is provided with a plurality of independent burn-in chambers 101, in each equipment casing 1 The shell is equipped with air circulation system, temperature control system, over-temperature protection system and product power supply system;

[0054] A heat insulating layer 113 is arranged in the shell of the device, and an air channel plate 109 is arrang...

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Abstract

The invention discloses large-scale high-temperature test equipment applied to the reliability test of a solid-state disk. The large-scale high-temperature test equipment includes a housing of the equipment. The housing is provided with a plurality of independent aging chambers, and the shell of each housing is provided with a wind circulation system, a temperature control system, an over-temperature protection system and a product power supply system. The large-scale high-temperature test equipment is energy-saving and environmentally-friendly, the power source of each high-temperature chamber can be controlled independently, and the reasonable use of each aging chamber can be individually controlled. Frequent shutdown, starting-up, heating, cooling and other operation of the equipment can be minimized. Compared with other equipment with same production capacity, at least 40% of power consumption is saved. A product test rack adopts a cart-type aging rack, and a cart type design is used. Universal wheels are installed at the bottom of the rack body, and the product test rack is easy to push and pull when in use.

Description

technical field [0001] The invention relates to high-temperature aging equipment, in particular to a large-scale high-temperature testing equipment used in reliability testing of solid-state hard disks. Background technique [0002] As we all know, the high-temperature aging room is a high-temperature and harsh environment test equipment for high-performance electronic products. It is an important experimental equipment to improve product stability and reliability, and an important production process for various manufacturers to improve product quality and competitiveness. , The device is widely used in power electronics, computers, communications, biopharmaceuticals and other fields. [0003] Traditional aging equipment has several disadvantages: [0004] 1. The insulation performance of the equipment is poor, and the circuit settings of the traditional aging equipment and the frame are unreasonable. When the product is unqualified for aging, it is necessary to open the do...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56G05D23/19
CPCG05D23/19G11C29/56G11C29/56016
Inventor 倪黄忠
Owner SHENZHEN SHICHUANGYI ELECTRONICS
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