Detection method and device for short circuit fault

Abstract

The invention provides a method and device for detecting a short circuit failure. The detection method of the short circuit failure includes: during the first time period included in the detection phase, providing the first external compensation control voltage to the external compensation control terminal to control the conduction of the external compensation control transistor; during the detection period included in the detection phase , providing a second external compensation control voltage to the external compensation control terminal to control the external compensation control transistor to turn off; during the detection period, the anode layer is arranged opposite to the conductive electrode layer included in the detection instrument, and the liquid crystal layer is controlled to be arranged on the anode Between the conductive electrode layer and the conductive electrode layer, it is judged whether there is a short circuit defect in the corresponding external compensation pixel drive circuit according to whether there is a dark spot on the liquid crystal layer. The invention can accurately display defects in dark spots, thereby accurately locating the position of a defect in a short circuit.

Description

technical field [0001] The invention relates to the technical field of display failure detection, in particular to a short circuit failure detection method and device. Background technique [0002] Making OLED (Organic Light Emitting Diode) screens is very complicated, and each layer requires a lot of manpower and material resources. Usually, the fabrication of the Array substrate is completed in the Array (array) process section first. On the fabrication of the array substrate, the gate metal layer, gate insulating layer, active layer, etch barrier layer, and source-drain metal layer are sequentially fabricated on the substrate substrate. , passivation layer, OLED light-emitting layer, anode layer. After finishing the anode layer made of ITO (indium tin oxide), Array Test (array test) will be carried out. In fact, it is a selection process. The glass (glass) with good performance is left and sent to the next stage. For Glass that does not meet the requirements is screened...

AI Technical Summary

Problems solved by technology

[0003] The main purpose of the present invention is to provide a short-circuit detection method and device to solve the problem that in the prior art, because the design of the display panel adopts the design of the full panel power line, the input terminal of the power supply voltage is fed with a large positive voltage, which will cause the array During detection, there is a voltage difference between the conductive electrode layer and the detection instrument end to form a capacitance, so that the defects that should be dark spots are also displayed as bright spots on the device, resulting in inaccurate detection results of short-circuit defects

Images