Three-dimensional reconstruction system and method for electronic microscopic scene
A technology of three-dimensional reconstruction and electron microscopy, applied in the field of microscopic vision, can solve the problems of inability to obtain object texture information, inability to obtain texture information, and not suitable for microscopic scenes, and achieve the effect of rich texture information.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0053] figure 1 It is a flowchart of a three-dimensional reconstruction method in an electron microscope scene of the present invention.
[0054] In this example, if figure 1 As shown, the present invention provides a three-dimensional reconstruction method under an electron microscope scene, comprising the following steps:
[0055] S1. Using an electron microscope to obtain images to be fused with different focal lengths
[0056] Use a pair of Milon KTF position sensors to locate the upper limit position and lower limit position required for 3D reconstruction, and the DSP device sends out control instructions, which are converted into pulse signals by a digital-to-analog converter to control the rotation of the servo motor to drive the object distance screw alignment of the lens barrel. The focus is rotated at a fixed angle for multiple times, and the control command is transmitted to the industrial camera through the USB control line, and the image of the microscope is sho...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com