Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Realization method of linear TDI type infrared detector area array imaging mode

An infrared detector and area array imaging technology, applied in the field of infrared imaging, can solve the problems of inability to effectively establish pixel arrangement and imaging data, increase the difficulty of integrated assembly and adjustment, etc., achieve rich testing methods and debugging methods, intuitive results, The effect of a short development cycle

Active Publication Date: 2018-04-06
TIANJIN JINHANG INST OF TECH PHYSICS
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the installation and adjustment of the area array detector, the positional relationship between the target and the pixel is usually determined by using a straight-line target to determine the position of the line array. However, the normal working mode of the line array TDI device is TDI integration, and the obtained imaging data is As a result of the joint action of multiple pixels, the relationship between pixel arrangement and imaging data cannot be effectively established, which increases the difficulty of system integration and adjustment. , if the imaging data can correspond to the arrangement of pixel positions, the efficiency of integrated assembly and adjustment will be greatly improved

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Realization method of linear TDI type infrared detector area array imaging mode
  • Realization method of linear TDI type infrared detector area array imaging mode
  • Realization method of linear TDI type infrared detector area array imaging mode

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] In order to make the purpose, content, and advantages of the present invention clearer, the specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0025] During the integration and adjustment process of the multi-spectral imaging system, the lines of the TDI infrared detectors in each spectral segment are strictly consistent, and the imaging direction is strictly parallel to the scanning direction of the platform. The pixel arrangement of the line TDI infrared detectors is as follows: figure 1As shown in the figure, the figure takes a 512×6-element linear TDI infrared detector as an example. Every 6 pixels form an imaging channel. In the TDI integral working mode, the imaging is completed in the X-direction in TDI mode, and the detector output results is the accumulated value of the imaging results of 6 pixels, and the Y direction is the line direction of the dete...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a realization system of a linear TDI type infrared detector area array imaging mode. The realization system realizes the area array imaging mode output through a Bypass testingmode, and comprises an upper computer, a preprocessing device and a linear TDI type infrared detector; the upper computer sends an area array work command to the preprocessing device; the preprocessing device starts setting a linear TDI type infrared detector control register after receiving the command of the upper computer, and continuously switches the content of relevant bits of the Bypass testing mode, thereby enabling the detector to output a determined pixel line imaging signal; the preprocessing device receives an analog imaging signal output by a conversion detector, and finally sends the arranged digital imaging data to the upper computer; and the upper computer accomplishes the image display and storage. The realization system disclosed by the invention is simple and practicable, visual in result, and short in development period, improves the integration level of the preprocessing device, and provides the technical support for the practicability of the linear TDI type infrared detector.

Description

technical field [0001] The invention belongs to the technical field of infrared imaging, and relates to a method for realizing an area array imaging mode of a linear TDI type infrared detector. Background technique [0002] The linear TDI infrared detector is an important photoelectric load in the field of remote sensing surveying and mapping. Its TDI linear push-broom working mode can realize the acquisition of large and wide imaging data. Multispectral imaging systems often integrate multiple linear TDI infrared detectors. Realize multi-spectral imaging data acquisition and provide the basis for later spectral fusion. In the multi-spectral linear array TDI infrared detector integrated system, in order to ensure the geometric accuracy of imaging data, the scanning direction must be strictly perpendicular to the direction of detector pixel array arrangement; in order to ensure that the spectral data can be fused, each array The consistency of the lines must be guaranteed be...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/33H04N5/369H04N5/372
CPCH04N5/33H04N25/701H04N25/711
Inventor 马丰沈玉秀
Owner TIANJIN JINHANG INST OF TECH PHYSICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products