CCD/CMOS parameter detection system

A parameter detection and detection device technology, applied in the direction of TV, electrical components, image communication, etc., can solve the problems of unreliable parameter detection and not supporting multiple CCD/CMOS output modes, etc.

Pending Publication Date: 2018-05-25
CHANGCHUN UNIV OF SCI & TECH
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] In view of the problems referred to above, the purpose of the present invention is to provide a CCD/CMOS parameter detection system to s

Method used

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  • CCD/CMOS parameter detection system
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[0025] In the following description, for illustrative purposes, in order to provide a comprehensive understanding of one or more embodiments, many specific details are set forth. However, it is obvious that these embodiments can also be implemented without these specific details. In other examples, for the convenience of describing one or more embodiments, well-known structures and devices are shown in the form of block diagrams.

[0026] figure 1 The overall structure of the CCD / CMOS parameter detection system according to the embodiment of the present invention is shown.

[0027] Such as figure 1 As shown, the CCD / CMOS parameter detection system provided by the embodiment of the present invention includes: a hardware detection device and a control device; wherein the hardware detection device includes an integrating sphere 2, an optical darkroom 3 and a working platform 25, an integrating sphere 2 and an optical darkroom 3 All are set on the working platform 25.

[0028] The inte...

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Abstract

The invention provides a CCD/CMOS parameter detection system. The CCD/CMOS parameter detection system comprises a hardware detection device and a control device, wherein the hardware detection devicecomprises a working platform, and an integrating sphere and an optical darkroom are arranged on the working platform; the integrating sphere is provided with three light sources, illuminometer probesand light outgoing openings, and an identifying rate plate is arranged at the light outgoing opening; a varifocus adjusting mechanism, an optical lens precision adjustment platform, a CCD/CMOS precision adjustment clamp, a varifocus lens set and a to-be-detected CCD/COMS are arranged in the optical darkroom, and the to-be-detected CCD/COMS, the varifocus lens set and the second light outgoing opening form a straight line; an industrial control computer, an illuminance meter, driving power sources of the three light sources and a CCD/CMOS power source are arranged in the working platform; the control device comprises a power source controller and a multifunctional collecting card, the power source controller is connected with the industrial control computer and the three driving power sources, and the multifunctional collecting card is inserted into the industrial control computer and is connected with the to-be-detected CCD/COMS through a data table. The CCD/CMOS parameter detection system is not interfered by outside light sources, and CCD/CMOS testing under natural light can also be simulated.

Description

Technical field [0001] The invention relates to the field of CCD / CMOS detection technology, and more specifically, to a CCD / CMOS multi-parameter detection system. Background technique [0002] At present, CCD / CMOS is widely used in digital photography, aerospace, astronomical exploration, spectrum telescope and other fields. In industry, CCD / CMOS is used to measure size, collect images, and detect high temperatures. CCD / CMOS can directly convert optical signals into digital electrical signals to achieve image acquisition, storage, transmission, processing and reproduction. Its notable features are: 1. Small size and light weight; 2. Low power consumption, low working voltage, shock and vibration resistance, stable performance, and long life; 3. High sensitivity, low noise, and large dynamic range; 4. Fast response speed , With self-scanning function, image distortion is small, no afterimage; 5. Application of super large-scale integrated circuit technology production, high pixel...

Claims

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Application Information

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IPC IPC(8): H04N17/00
CPCH04N17/002Y02B20/00
Inventor 谭勇辛敏思贾强赵猛陈新邑蔡红星刘立欣张赤军
Owner CHANGCHUN UNIV OF SCI & TECH
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