CCD/CMOS parameter detection system

Abstract

The invention provides a CCD / CMOS parameter detection system. The CCD / CMOS parameter detection system comprises a hardware detection device and a control device, wherein the hardware detection devicecomprises a working platform, and an integrating sphere and an optical darkroom are arranged on the working platform; the integrating sphere is provided with three light sources, illuminometer probesand light outgoing openings, and an identifying rate plate is arranged at the light outgoing opening; a varifocus adjusting mechanism, an optical lens precision adjustment platform, a CCD / CMOS precision adjustment clamp, a varifocus lens set and a to-be-detected CCD / COMS are arranged in the optical darkroom, and the to-be-detected CCD / COMS, the varifocus lens set and the second light outgoing opening form a straight line; an industrial control computer, an illuminance meter, driving power sources of the three light sources and a CCD / CMOS power source are arranged in the working platform; the control device comprises a power source controller and a multifunctional collecting card, the power source controller is connected with the industrial control computer and the three driving power sources, and the multifunctional collecting card is inserted into the industrial control computer and is connected with the to-be-detected CCD / COMS through a data table. The CCD / CMOS parameter detection system is not interfered by outside light sources, and CCD / CMOS testing under natural light can also be simulated.

Description

Technical field [0001] The invention relates to the field of CCD / CMOS detection technology, and more specifically, to a CCD / CMOS multi-parameter detection system. Background technique [0002] At present, CCD / CMOS is widely used in digital photography, aerospace, astronomical exploration, spectrum telescope and other fields. In industry, CCD / CMOS is used to measure size, collect images, and detect high temperatures. CCD / CMOS can directly convert optical signals into digital electrical signals to achieve image acquisition, storage, transmission, processing and reproduction. Its notable features are: 1. Small size and light weight; 2. Low power consumption, low working voltage, shock and vibration resistance, stable performance, and long life; 3. High sensitivity, low noise, and large dynamic range; 4. Fast response speed , With self-scanning function, image distortion is small, no afterimage; 5. Application of super large-scale integrated circuit technology production, high pixel...

AI Technical Summary

Problems solved by technology

[0004] In view of the problems referred to above, the purpose of the present invention is to provide a CCD / CMOS parameter detection system to solve the existing CCD / CMOS parameter detection method, which does not support multiple CCD / CMOS output modes and unreliable parameter detection

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