Check patentability & draft patents in minutes with Patsnap Eureka AI!

A method and system for evaluating random verification quality based on coverage count statistics

A technology of coverage times and random verification, applied in CAD circuit design, special data processing applications, etc., can solve the problem that the coverage rate of function points cannot fully reflect the quality of random verification, so as to improve R&D efficiency, improve robustness, reduce The effect of human resources and time consumption

Active Publication Date: 2021-10-22
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] Based on the above problems, the present invention proposes a method and system for evaluating the quality of random verification based on coverage count statistics, which solves the technical problem that the coverage rate of function points cannot fully reflect the quality of random verification and guide the improvement of random parameters. In the coverage-driven verification process, the statistical method of the coverage rate is adjusted. In addition to whether it is covered or not, it is also necessary to count the number of coverages, and judge the uniformity of the function point coverage based on the statistical information, as a standard for evaluating the quality of random verification.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method and system for evaluating random verification quality based on coverage count statistics
  • A method and system for evaluating random verification quality based on coverage count statistics

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the accompanying drawings that need to be used in the embodiments. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention. For Those of ordinary skill in the art can also obtain other drawings based on these drawings without making creative efforts.

[0030] The method for evaluating random verification quality of the present invention can not only show the coverage of function points, but also help verifiers to obtain information such as whether the random verification is comprehensive and whether the setting of function points is reasonable, so as to improve the robustness of verification. At the same time, the automatic results statistics, output, preliminary analysis and other steps can effectively reduce the consumption of human resources and time, and improve the e...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides a method and system for evaluating the quality of random verification based on statistics of coverage times, setting function points to be covered, function points requiring statistics of coverage times, random verification parameters, output conditions of statistical results of coverage times, and alarm conditions of statistical result analysis , carry out random verification, collect function coverage and function coverage times, if the output conditions of the coverage statistics result are met, then output the coverage statistics results, automatic preliminary analysis, if not, continue the random verification, and send an alarm if abnormal conditions are found. The invention improves the robustness of verification, effectively reduces the consumption of human resources and time, and improves the research and development efficiency.

Description

technical field [0001] The present invention relates to the technical field of chip design, in particular to a method and system for evaluating random verification quality based on coverage count statistics. Background technique [0002] With the continuous development of process technology and application fields, the complexity of chips continues to increase, and correspondingly, the requirements for simulation verification work are also constantly increasing. Not only are the function points that need to be verified by simulation more and more complicated, but also the requirements for the verification cycle are becoming more and more stringent. [0003] In the existing chip design process, it is divided into two stages: front-end design (logical design) and back-end design (physical design). The front-end design is mainly to realize the logic function of the chip through the hardware description language (such as verilog), and the correctness of the code description is m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/33
CPCG06F30/30
Inventor 李拓
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More