Color object three-dimensional profile measurement method

A three-dimensional profile and measurement method technology, applied in the field of optical measurement, can solve the problem of low measurement accuracy, and achieve the effect of taking into account measurement speed, good sine, and good structure light fringe compensation effect

Active Publication Date: 2018-06-29
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0011] The purpose of the present invention is to provide a method for measuring the three-dimensional profile of a colored object, which solves the technical problem of low measurement accuracy caused by the interference of the color of the color object in the existing measurement method

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  • Color object three-dimensional profile measurement method
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  • Color object three-dimensional profile measurement method

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Embodiment Construction

[0035] The invention is a three-dimensional profile measurement method of a colored object, which can weaken the interference of the color of the colored object on the three-dimensional measurement of structured light projection, and specifically includes the following steps:

[0036] The first step is to use a photometer to measure the three-channel coupling matrix A of the color 3CCD camera, because the three-channel coupling matrix A belongs to the property of the camera itself and has nothing to do with the specific spatial position of the pixels in the actual collected image, and it only needs to be measured once in advance. The result can be used for the correction of all pixels of the image collected later, and the expression of the three-channel coupling matrix A is as follows:

[0037]

[0038] And calculate its inverse matrix A -1 ;

[0039] The second step is to design three fringe images composed of red, green, and blue colors. The first image is a gray-coded f...

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Abstract

The invention belongs to the technical field of optical measurement, and specifically relates to a color object three-dimensional profile measurement method. According to the invention, a three-channel coupling matrix of a 3CCD camera is measured by a photometer, then the influence of a physical device on the measurement process is eliminated, and the precision is higher than that of a process ofprojecting red, green and blue images onto white paper and calculating the coupling matrix; and the surface albedo of the color object is worked out, and such process is substantially equivalent to projecting three-primary colors onto each point of the object, and complementary colors are overlapped based on the complementary relationship so that the obtained surface albedo matrix K offsets the interference. Compared with the reflectivity K obtained by projecting uniform white light, the process of projecting complementary color stripes can realize a better compensation effect on the structured light stripes, and the compensated image has better sine property. By adopting the method, the three-dimensional profile information of the color object can be obtained more accurately just by projecting four images to the surface of the color object while the measurement speed is also taken into consideration, and the aim of quick measurement can be achieved.

Description

technical field [0001] The invention belongs to the technical field of optical measurement, and in particular relates to a method for measuring a three-dimensional profile of a colored object. Background technique [0002] Existing instruments for three-dimensional profile measurement of colored objects mainly use one-dimensional or two-dimensional mechanical devices to control structured light to scan objects. The common disadvantage of these instruments is that the measurement speed is relatively slow. For example, the Italian National Research Council uses structured light scanning to realize color three-dimensional profile measurement instruments, and Japan's Konica Minolta's Vivid910 series portable laser scanners use the principle of laser triangulation. [0003] The structured light projection measurement system has the advantages of fast measurement speed and one-time imaging of the whole field. However, the measurement object of the existing structured light projec...

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Application Information

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IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 宋宗玺李宝鹏李伟雷浩成鹏飞申超高伟樊学武
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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