Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method of quickly improving scab resistance of wheat in Huang-Huai area

A technology for wheat head blight and head blight, applied in the direction of plant genetic improvement, botanical equipment and methods, applications, etc., can solve problems such as difficult to quickly achieve goals, and achieve accurate and effective identification results

Active Publication Date: 2018-07-06
河南天民种业有限公司
View PDF3 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It is difficult to combine the breeding materials with head blight resistance with the wheat varieties of the Yellow-Huaihe wheat region with multiple ears, large ears, dwarf lodging resistance, compact plants and leaves, and raised leaves. achieve goals quickly

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0028]Example 1 A method for rapid improvement of resistance to head blight of the main cultivar Dwarf Kang 58 in the Huanghuai wheat region

[0029] In this example, the main cultivar Aikang 58 in the improved Huanghuai wheat region is a semi-winter mid-maturing variety, with creeping seedlings, light green leaves in winter, many tillers, strong frost resistance, steady growth in spring, and strong tillers. The plant height is about 70cm, high resistance to lodging, and good plumpness. The three elements of yield are coordinated, the number of ears per mu is about 450,000, the number of grains per ear is 38-40, and the weight of thousand grains is 42-45g. High resistance to powdery mildew, stripe rust, leaf blight, moderate resistance to sheath blight, strong root system vitality, good yellowing when mature. Generally, the yield per mu is 500-550kg, and the highest can reach 700kg.

[0030] In this example, the scab-resistant source variety Shengxuan No. 6 belongs to spring...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of wheat breeding and particularly relates to a method of quickly improving scab resistance of wheat in the Huang-Huai area. The method integrates ecotypicvarieties with the characteristics of higher stems, a loose plant type and wide and unrolled leaves in a wheat area in the middle and lower reaches of Changjiang River with ecotypic wheat varieties with the characteristics of many and large ears, short stems, lodging resistance, compact plants and leaves and upward leaves in the Huang-Huai wheat area on a basis of the conventional breeding technology, and quickly improves the scab resistance of the wheat in the Huang-Huai wheat area by comprehensively taking many technical measures such as additive generation in a different place, a molecularmarker technology and a haploid induction technology.

Description

technical field [0001] The invention belongs to the technical field of wheat breeding, and in particular relates to a method for rapidly improving wheat scab resistance in the Huanghuai region. Background technique [0002] First of all, the northward movement of wheat scab has led to the increasing damage of scab in the main wheat producing areas of Huanghuai River in my country. Wheat scab is caused by Fusarium graminearum ( Fusarium graminearum Schwabe) caused a worldwide wheat disease, and it is an important disease in my country's wheat production. Wheat scab is one of the important factors affecting the high yield, stable yield and quality of wheat. Scab not only directly reduces yield, but also seriously affects the quality and utilization value of wheat kernels. The grain quality of wheat affected by scab damage is significantly reduced, the starch content of diseased wheat grains is reduced, reducing sugar is increased, soluble nitrogen and fatty acid are increa...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): A01H1/02A01H1/04
CPCA01H1/02A01H1/04
Inventor 罗明洁朱恩谷水云杨丽健任秋芳沈天民
Owner 河南天民种业有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products