Method and system for obtaining parameter change status of vacuum electronic device under thermal state

A vacuum electronic device and parameter change technology, applied in the field of vacuum electronics, to achieve the effects of simplifying thermal deformation analysis, improving work performance, and optimizing work parameters

Active Publication Date: 2021-04-06
SOUTHEAST UNIV
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  • Abstract
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Problems solved by technology

However, there is still no conclusion on how the return wave oscillation of the traveling wave tube will change under the specific thermal state, and how the resulting output parameters will change.

Method used

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  • Method and system for obtaining parameter change status of vacuum electronic device under thermal state
  • Method and system for obtaining parameter change status of vacuum electronic device under thermal state
  • Method and system for obtaining parameter change status of vacuum electronic device under thermal state

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Embodiment Construction

[0044]The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention. The invention can also be applied to study the influence of thermal state on the performance of vacuum electronic devices such as klystrons and magnetrons.

[0045] figure 1 It is a flow chart of a calculation method for vacuum electronic device performance parameters in a thermal state according to the present invention, including the following steps: a calculation method for vacuum electronic device performance parameters in a thermal state, including the following steps:

[0046] The first step is to establish a vacuum electronic device model, input the working parameters of the vacuum electronic device, calculate the injection wave interaction of the vacuum electro...

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Abstract

A method and system capable of accurately knowing the parameter variation of a vacuum electronic device in a thermal state. Firstly, a vacuum electronic device model is established to calculate its injection-wave interaction; thermal analysis is performed according to the heat source parameters obtained from the injection-wave interaction; thermal deformation parameters are calculated according to the temperature distribution obtained by thermal analysis; the vacuum electronic device model is revised according to the thermal deformation parameters Calculate the injection-wave interaction to obtain the performance parameters of the vacuum electronic device in the thermal state. The invention corrects the parameters of the vacuum electronic device model in the thermal state through the thermal deformation parameters, and finally forms a synergistic analysis loop of injection wave interaction-heat-thermal deformation- injection wave interaction. Through the closed-loop system, the present invention can comprehensively analyze the working characteristics of the vacuum electronic device in the working state, especially in the thermal state, and can accurately know the influence of the thermal state on the performance of the vacuum electronic device.

Description

technical field [0001] The invention relates to the field of vacuum electronics, in particular to a method and system capable of accurately knowing the variation of device performance parameters in a thermal state. Background technique [0002] As a vacuum electronic device used to amplify high-frequency signals, traveling wave tubes have the advantages of broadband and high power, and are the core devices in radar, communication, and electronic countermeasure systems. The traveling wave tube mainly uses the interaction between the electron beam and the high-frequency electromagnetic field, and transfers the energy of the electron beam to the high-frequency electromagnetic field to realize signal amplification and output a signal with a certain power. [0003] In engineering applications, it is found that when vacuum electronic devices such as traveling wave tubes are working, the thermal state inside the tube will have an important impact on the working performance of the t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/17G06F119/08
CPCG06F30/17
Inventor 孙小菡张劲
Owner SOUTHEAST UNIV
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