Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Full-field oct system using wavelength-tunable laser and three-dimensional image correction method

A large-area, image-based technology, applied in the field of large-area OCT systems, can solve problems such as the influence of interference signals, and achieve the effect of simplifying algorithms

Active Publication Date: 2018-07-31
株式会社高迎科技 +1
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, if there is movement of the measurement object during the acquisition of the interference image by the large-area OCT system, the interference signal is easily affected by the movement of the measurement object

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Full-field oct system using wavelength-tunable laser and three-dimensional image correction method
  • Full-field oct system using wavelength-tunable laser and three-dimensional image correction method
  • Full-field oct system using wavelength-tunable laser and three-dimensional image correction method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042] The embodiments of the present invention are illustrated for the purpose of illustrating the present invention. The embodiments of the present invention can be implemented in various forms, and it should not be construed that the present invention is limited to the embodiments presented below or the specific descriptions of these embodiments.

[0043] The term "part" used in this embodiment means software, hardware components such as FPGA (field-programmable gate array, field-programmable gate array), ASIC (application specific integrated circuit, application specific integrated circuit). However, a "part" is not limited to hardware and software. A "part" can be configured to be located in an addressable storage medium, or can be configured to be played by one or more processors. Thus, as an example, a "part" includes components such as software components, object-oriented software components, class components, and task components, as well as processors, functions, att...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides a full-field OCT system using a wavelength-tunable laser, which can observe peaks of a short-time A-line profile corresponding to each time point at which interference images of an object to be measured are acquired, so as to measure a depth direction movement of the object to be measured, and can correct the phases of interference signals on the basis of the measured depth direction movement, so as to generate an OCT image which is compensated for the depth direction movement.

Description

technical field [0001] The invention relates to a large-area OCT system using a wavelength tunable laser and an image correction method in the system. Background technique [0002] OCT technology is a medical imaging technology that can visualize cross-sectional images of living tissue with a resolution of about 10 to 30 μm. The OCT system can generate a three-dimensional OCT image of the object to be measured using an interference image formed by interference between reference light reflected by a laser beam from a reference mirror and reflected light reflected by the object to be measured. [0003] The OCT system can be classified into a single point scanning OCT system and a full-field OCT system according to the method of irradiating the laser beam to the object to be measured. In the single-point scanning OCT system, an OCT image of the object to be measured can be generated by using an interference image obtained by scanning a laser beam irradiated to one point of the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): A61B5/00G01B9/02G01N21/45
CPCA61B5/0066A61B5/0077A61B5/7207A61B2576/00G01B9/02004G01B9/02041G01B9/02077G01B9/02083G01B9/02091G16H30/40A61B5/0033G01B9/02067G01B9/02076G01N21/45
Inventor 李贤箕柳洪基金昌洙南亨树
Owner 株式会社高迎科技
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com