A non-contact high-precision length measuring system with adjustable scale
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- ηε
- Publication Date
- 2020-01-17
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Abstract
Description
technical field
[0001] The invention relates to the field of optical precision measurement, in particular to a non-contact high-precision length measurement system with adjustable scale. Background technique
[0002] During the processing of workpieces such as cutting and grinding, if the operator needs to confirm the size of the current workpiece, he usually uses length measuring tools such as vernier calipers, screw micrometers or micrometers. However, the measurement process based on the above tools will inevitably interrupt the processing of the workpiece, so the measurement of the workpiece size will have a certain impact on the processing progress of the workpiece. In addition, during the measurement process, especially multiple measurements, the error caused by the difficulty in aligning the measurement tool with the workpiece will affect the machining accuracy of the workpiece.
[0003] The principle of optical interference in optics has a wide range of applications...