Self-reference measuring device for axial chromatic aberration of multiphoton microscope

A technology of multiphoton microscope and measuring device, which is applied in the direction of measuring device, color/spectral characteristic measurement, and material analysis through optical means, which can solve the problems of measurement accuracy limitation and achieve the effect of eliminating mechanical errors

Inactive Publication Date: 2018-08-31
SHENZHEN UNIV
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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a self-referencing measuring device for axial chromatic aberration in a multiphoton microscope, which aims to solve the problem that the measurement accuracy is limited by the precision of the mechanical translation stage when measuring the axial chromatic aberration in the prior art

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  • Self-reference measuring device for axial chromatic aberration of multiphoton microscope
  • Self-reference measuring device for axial chromatic aberration of multiphoton microscope
  • Self-reference measuring device for axial chromatic aberration of multiphoton microscope

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[0046] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0047] figure 1 It shows a self-referencing measurement device for axial chromatic aberration in a multiphoton microscope provided by an embodiment of the present invention, including an excitation unit 101, a first optical path adjustment unit 102, a soliton generation unit 103, a second optical path adjustment unit 104, a multiphoton Microscope unit 105 and signal collection unit 106:

[0048] an excitation unit 101, configured to generate pump light with a preset wavelength, and inject the pump light into the first optical path adjustment unit 102;

[0049] The first optical path adjustment un...

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Abstract

The present invention is applicable to the field of optoelectronic technology, and provides a self-reference measuring device; the self-reference measuring device comprises an excitation unit, a firstoptical path adjusting unit, a soliton generating unit, a second optical path adjusting unit and a multiphoton microscope unit. The excitation unit is used for generating pump light with a preset wavelength and allowing the pump light to enter the first optical path adjusting unit; the first optical path adjusting unit is used for adjusting the polarization state of the pump light and allowing the pump light to enter the soliton generating unit, the the soliton generating unit is used to generate a laser pulse according to the pump light and allow the laser pulse to enter the second optical path adjusting unit; the second optical path adjusting unit is configured to process the laser pulse and allow the laser pulse to enter the multiphoton microscope unit, and the multiphoton microscope unit is used for measuring axial chromatic aberration based on imaging of a sample and transmitting harmonic signals to a signal collection unit for collection. The self-reference measuring device doesnot require a mechanical displacement platform to repeat scanning all the time, thereby eliminating mechanical errors introduced by the displacement platform when monochromatic excitation light repeatedly scanns.

Description

technical field [0001] The invention belongs to the field of optoelectronic technology, in particular to a self-reference measuring device for axial chromatic aberration in a multiphoton microscope. Background technique [0002] Multiphoton microscopy is an essential technology for subcellular observation of the structure or dynamic behavior of biological samples in vivo or in vitro. In multiphoton microscopy, the signal is generated only at the focal point, thus possessing the capability of intrinsic three-dimensional imaging. Through the two-dimensional scanning of the two-dimensional scanning galvanometer or the translation stage, a two-dimensional image of the focus layer can be obtained. In multiphoton microscopy imaging, tunable lasers are generally used to obtain high-efficiency exogenous or endogenous multiphoton signals. [0003] Focusing and diverging optics are widely used in multiphoton microscopy, such as scanning lenses, tube lenses and objectives. Since the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01G01N21/27
CPCG01N21/01G01N21/274
Inventor 邱娉王科杜毓庄自伟
Owner SHENZHEN UNIV
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