Organic photoelectric material molecular orientation characterization method

Abstract

The invention discloses an organic photoelectric material molecular orientation characterization method. The method includes: establishing a film transmission matrix of a to-be-tested sample accordingto a characteristic matrix of each film in an optical model by establishing the optical model of the to-be-tested sample; constructing and parameterizing a dielectric function model of a to-be-testedsample material to obtain optical constants of the to-be-tested sample, calculating according to the optical constants and the film transmission matrix to obtain a theoretical Mueller matrix spectrumof the to-be-tested sample, adopting an iterative algorithm for fitting the theoretical Mueller matrix spectrum with a measured Mueller matrix spectrum to extract an extinction coefficient of the sample, and calculating to obtain molecular orientation of the to-be-tested sample according to a constructed model of relation between molecular orientation of the to-be-tested sample and the extinctioncoefficient. By creation of a universal analysis method, the 4*4 Mueller matrix obtained by measurement with a Mueller matrix ellipsometer is calculated and analyzed to obtain molecular orientation of a photoelectric material, and the method is suitable for quick and accurate calibration of organic molecular orientation in organic photoelectric devices.

Description

technical field [0001] The invention belongs to the technical field of small molecule organic optoelectronics, and more specifically relates to a method for characterizing the molecular orientation of organic optoelectronic materials based on Muller matrix ellipsometer, which is applicable to the rapid determination of the molecular orientation degree of organic thin layer materials in organic optoelectronic devices. Accurate calibration. Background technique [0002] The orderly orientation of molecules is one of the most important properties of small molecule organic photoelectric material thin films; in organic light-emitting diodes, photons are emitted from the light-emitting layer, most of which are lost due to total internal reflection, changing the orientation of organic light-emitting molecules, The emission angle of the light-emitting dipole can be changed, thereby reducing the generation of the total internal reflection phenomenon, so that more photons can be effec...

AI Technical Summary

Problems solved by technology

When measuring with an ordinary ellipsometer, only two measurement parameters, the amplitude ratio and the phase difference, can be obtained under each set of measurement conditions. To characterize molecular orientation, it is necessary to measure multiple azimuth angles or multiple incident angles to obtain multiple sets of amplitude ratio and phase difference data. By changing the angle measurement method, the anisotropic film can be more sensitively characterized to determine its anisotropic optical constants. The measurement process is complex and time-consuming; in addition, the measurement process such as changing the azimuth and incident angle is usually realized by mechanical movement, which will introduce systematic errors and inevitably reduce the measurement accuracy, etc.

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