Solar cell process traceability method

A solar cell and process technology, applied in circuits, electrical components, final product manufacturing, etc., can solve problems such as increasing production costs, increasing the difficulty of process and quality control, and inability to match process parameters before and after, to improve work efficiency, reduce Production cost, the effect of traceability

Active Publication Date: 2018-09-14
HANWHA SOLARONE QIDONG
View PDF5 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Usually, the parameters of each process of each cell are independent, and it is impossible to effectively match the parameters of the front and rear processes
If there is an abnormality in the quality of the battery sheet in the end, analysis by some conventional

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Solar cell process traceability method
  • Solar cell process traceability method
  • Solar cell process traceability method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] Such as image 3 As shown, a solar cell manufacturing process traceability method in this embodiment mainly includes the following steps:

[0023] Step S1: Install coding and code reading equipment

[0024] In this embodiment, the coding equipment is integrated after the silicon wafer appearance and electrical performance testing equipment, and the code reading equipment is installed on the silicon wafer appearance and electrical performance testing and subsequent manufacturing equipment.

[0025] The coding equipment in this embodiment adopts laser engraving, which can engrave identification codes on the front side of the silicon wafer. The accuracy of laser marking is ±200um, and the depth of laser marking is 5~50um.

[0026] Step S2: Laser marking and reading

[0027] During the battery production process, the silicon wafers are inspected for their appearance and electrical properties and enter the coding equipment and code reading equipment for laser engraving an...

Embodiment 2

[0042] refer to figure 2 , a solar cell manufacturing process tracing method in this embodiment is basically the same as in Embodiment 1, the difference is that the identification code in this embodiment is a barcode.

[0043] A solar cell manufacturing process traceability method of the present invention uses a laser engraving and code reading recognition system to effectively single-match silicon wafer appearance and electrical performance inspection information and battery process monitoring information through engraving and code reading identification, thereby Realize effective traceability of battery process information. Through traceable information, it is possible to grasp the raw material quality and manufacturing process of each battery. On the one hand, it provides direction for technological improvement; on the other hand, it lays a solid foundation for battery quality. Improve work efficiency and reduce production costs.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Depthaaaaaaaaaa
Login to view more

Abstract

The invention discloses a solar cell process traceability method. The method comprises the following steps: a code printing device is arranged behind a silicon wafer appearance and electrical propertydetection procedure device, the code printing device enables a recognition code to be on the silicon wafer, a code reading device is arranged on other procedure devices in a silicon wafer process, the code reading device reads the recognition code of each silicon wafer, correspondence with the process parameters in the current procedure is carried out, and all data in the procedure are finally connected to a manufacturing execution system and are stored. According to the solar cell process traceability method, through a laser coding and code reading and recognition system, the silicon wafer appearance and electrical property detection information and the cell process monitoring information are subjected to effective single matching, and thus, effective traceability on the cell process information is realized. Through the traced information, the raw material quality condition and the process condition of each cell can be mastered, on one hand, a direction is provided for technical improvement, and on the other hand, a solid foundation is laid for the cell quality, and the working efficiency is enhanced, and the production cost is reduced.

Description

technical field [0001] The invention belongs to the technical field of solar cell manufacturing, and in particular relates to a solar cell manufacturing process tracing method. Background technique [0002] With the continuous acceleration of economic globalization and the rapid development of industrial economy, worldwide energy shortage and environmental pollution have become important issues restricting the sustainable development of human society. It is urgent to vigorously develop renewable and non-polluting energy. The inexhaustible, inexhaustible, and non-polluting properties of solar energy have attracted more and more attention from governments and people. With the continuous development of photovoltaic technology, solar cell products, which are semiconductor devices that convert solar energy into electrical energy, have also been recognized. Fast development. [0003] In the solar cell manufacturing process, the quality of raw materials and the control of each pro...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H01L21/67H01L31/18
CPCH01L21/67276H01L31/18Y02P70/50
Inventor 沈健刘晓兵赵福祥金起弘张大荣黄健
Owner HANWHA SOLARONE QIDONG
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products