A test method for detecting memory single event disturbance using proton as radiation source

Abstract

The invention discloses a test method for detecting single particle disturbance of memories by taking protons as a radiation source. The method comprises the following steps of selecting memory samples; performing power-on total parameter testing on the selected memory samples to verify functions of the memory samples; selecting proton beams with certain energy and fluence rates on a medium and high-energy proton accelerator; connecting the memories and a circuit board well, and performing power-on testing again; filling all the memories with data; backwards reading the data from the memories,and turning on the proton beams meeting the requirements when a test system is stable, thereby performing irradiation on the single memory; and moving the subsequent memories to the beam output positions of the beams in sequence, and replacing the energy of the proton beams, until all energy points are tested. The single particle disturbance effect is detected by taking the protons as the radiation source; compared with other radiation sources, the protons are more reliable, simpler and more convenient; and the data extraction accuracy is ensured while the efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of single-event disturbance testing, in particular to a test method for detecting single-event disturbance of a storage device using protons as a radiation source. Background technique [0002] In the field of aerospace, more and more memories are applied to satellites, spacecraft, and aircraft. Due to its special working environment, the memory has to face the radiation of various particles and rays, resulting in various failure phenomena. With the development of science and technology, memory is developing towards higher and higher integration. Recent studies have shown that the impact of a single particle on memory becomes more and more obvious with the increase of integration, and this trend becomes more and more more serious. [0003] Single-event disturbance is one of the single-event effects. It is due to the single charged particle incident into the memory, in the track of the particle incident sem...

AI Technical Summary

Problems solved by technology

However, due to the absence of high-energy proton accelerators in China, there are not many research results on proton single event effects in China.

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