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A preparation device and method for spectral sample control

A preparation device and spectrum technology, which is applied in the field of spectrum control sample preparation, can solve the problems of bottom shrinkage, porosity, and top shrinkage, and achieve the effects of improving composition uniformity, improving fluidity, and increasing top feeding capacity

Active Publication Date: 2021-06-04
武汉泛洲中越合金有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0010] The purpose of the present invention is to provide a preparation device and method for spectral control sample, which is used to solve the technical problem that the spectral control sample prepared by the existing method is prone to defects such as top shrinkage cavity, bottom shrinkage porosity, and pores.

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  • A preparation device and method for spectral sample control
  • A preparation device and method for spectral sample control
  • A preparation device and method for spectral sample control

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Embodiment Construction

[0046] The present invention provides many applicable inventive concepts that can be embodied in numerous specific contexts. The specific examples described in the following embodiments of the present invention are only used as illustrations of specific embodiments of the present invention, and are not intended to limit the scope of the present invention.

[0047] First the nouns involved in the present invention are explained:

[0048] Taper C: refers to the ratio of the diameter D of the bottom circle of the cone to the height H. Usually, the taper can be written in the form of 1:n. If it is a truncated cone, it is the ratio of the difference between the diameters of the upper and lower bottom circles to the height of the truncated cone.

[0049] Cone angle α: refers to the angle between the two generatrices of the axial section of the cone (the section passing through the axis of the cone). Taper C and taper angle α can be converted to each other, the relationship is: C=2...

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Abstract

The invention discloses a sample preparation device for spectral control, which comprises a riser, a mold and a bottom plate arranged in sequence along the vertical direction, the riser and the mold are connected to each other, and the hollow part of the riser and the mold is connected to form a storage space, the bottom of the mold is connected to the bottom plate, when the liquid metal is poured from the top of the riser, it is cooled in the containing space to form a spectral control sample, wherein, along the pouring direction of the liquid metal, the The inner diameter of the riser gradually decreases, and it includes at least two riser portions with different cone angles, so that the cooling speed of the liquid metal in the riser is different. The spectral control sample preparation device provided by the present invention is composed of different materials and different structures, and a temperature field that is conducive to sequential solidification is established from top to bottom along the pouring direction of the copper liquid, which can improve the existence of existing spectral control samples. Defects of shrinkage cavity at the top, shrinkage porosity at the bottom, and uneven structure.

Description

technical field [0001] The invention relates to the technical field of spectrum control sample preparation, in particular to a preparation device and method for spectrum control sample. Background technique [0002] Spectral control sample is a sample that is used as a reference standard when the spectrometer detects the chemical composition of the sample. It is required to have no casting defects such as shrinkage cavities, shrinkage porosity, pores, and slag inclusions. There are also extremely strict requirements for composition uniformity, and its quality directly affects To the accuracy of the spectrometer to detect the composition. In order to ensure the consistency of the detection conditions, it is generally required that the spectral control sample is in the same tissue state as the furnace sample, and the furnace sample is generally cast freely in a metal mold, so the process of the spectral control sample also needs to be consistent, that is, the liquid metal is d...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N1/36G01N1/42G01N1/28G01N21/31B22C9/08B22C9/06B22D27/08
CPCB22C9/06B22C9/088B22D27/08G01N1/286G01N1/36G01N1/42G01N21/31G01N2001/366G01N2201/13
Inventor 姚联
Owner 武汉泛洲中越合金有限公司
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