Device and method for preparing spectral control sample

A preparation device and spectrum technology, applied in the field of spectral sample control preparation, can solve the problems of pores, bottom shrinkage, top shrinkage, etc., and achieve the effects of improving composition uniformity, improving fluidity, and reducing heat loss

Active Publication Date: 2018-10-12
武汉泛洲中越合金有限公司
View PDF9 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] The purpose of the present invention is to provide a preparation device and method for spectral control sample, which is used to solve the technical problem that the spectral control sample prepared by the existing method is prone to defects such as top shrinkage cavity, bottom shrinkage porosity, and pores.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and method for preparing spectral control sample
  • Device and method for preparing spectral control sample
  • Device and method for preparing spectral control sample

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] The present invention provides many applicable inventive concepts that can be embodied in numerous specific contexts. The specific examples described in the following embodiments of the present invention are only used as illustrations of specific embodiments of the present invention, and are not intended to limit the scope of the present invention.

[0047] First the nouns involved in the present invention are explained:

[0048] Taper C: refers to the ratio of the diameter D of the bottom circle of the cone to the height H. Usually, the taper can be written in the form of 1:n. If it is a truncated cone, it is the ratio of the difference between the diameters of the upper and lower bottom circles to the height of the truncated cone.

[0049] Cone angle α: refers to the angle between the two generatrices of the axial section of the cone (the section passing through the axis of the cone). Taper C and taper angle α can be converted to each other, the relationship is: C=2...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a device for preparing a spectral control sample. The device comprises a riser head, a mold and a bottom plate which are sequentially arranged in a vertical direction, the riser head and the mold are connected to each other, the riser head is communicated with the hollow part of the mold to form an accommodating space, the bottom of the mold is connected to the bottom plate, and liquid metal is poured from the top of the riser head and is cooled in the accommodating space to form the spectral control sample, wherein the internal diameter of the riser head is gradually reduced along the pouring direction of the liquid metal, and the riser head includes at least two riser head parts having different taper angles to make the liquid metal have different cooling rates atthe riser head. The device for preparing the spectral control sample is formed by combining different materials and different structures, and a temperature field beneficial for sequential solidification is established along the pouring direction of a copper liquid from the top to the bottom, so the defects of top shrinkage, bottom shrinkage porosity and uneven microstructure existing in existingspectral control samples are overcome.

Description

technical field [0001] The invention relates to the technical field of spectrum control sample preparation, in particular to a preparation device and method for spectrum control sample. Background technique [0002] Spectral control sample is a sample that is used as a reference standard when the spectrometer detects the chemical composition of the sample. It is required to have no casting defects such as shrinkage cavities, shrinkage porosity, pores, and slag inclusions. There are also extremely strict requirements for composition uniformity, and its quality directly affects To the accuracy of the spectrometer to detect the composition. In order to ensure the consistency of the detection conditions, it is generally required that the spectral control sample is in the same tissue state as the furnace sample, and the furnace sample is generally cast freely in a metal mold, so the process of the spectral control sample also needs to be consistent, that is, the liquid metal is d...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01N1/36G01N1/42G01N1/28G01N21/31B22C9/08B22C9/06B22D27/08
CPCB22C9/06B22C9/088B22D27/08G01N1/286G01N1/36G01N1/42G01N21/31G01N2001/366G01N2201/13
Inventor 姚联
Owner 武汉泛洲中越合金有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap