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A method for detecting internal defects of terahertz materials based on Gaussian iterative algorithm

A terahertz material, Gaussian iteration technology, applied in the field of internal defect detection of terahertz material based on Gaussian iterative algorithm, can solve the problems of reducing the accuracy of defect detection position, not considering the propagation speed of electromagnetic waves, refraction, etc.

Active Publication Date: 2021-02-26
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology

[0010] The main disadvantage of the existing internal defect detection of materials based on active terahertz frequency modulation continuous wave imaging technology and terahertz time-domain spectrometer imaging technology is that the actual propagation speed of electromagnetic waves in the target material is not considered and the default is still 3e8m / s, when the electromagnetic wave is incident in the air and propagates inside the material, refraction will occur, thereby reducing the position accuracy of the method for defect detection

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  • A method for detecting internal defects of terahertz materials based on Gaussian iterative algorithm
  • A method for detecting internal defects of terahertz materials based on Gaussian iterative algorithm
  • A method for detecting internal defects of terahertz materials based on Gaussian iterative algorithm

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[0039] It should be pointed out that the following detailed description is exemplary and intended to provide further explanation to the present application. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

[0040] It should be noted that the terminology used here is only for describing specific implementations, and is not intended to limit the exemplary implementations according to the present application. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and / or combinations thereof.

[0041] In a typical implementation of the present application, such as image 3 As shown, a method for detectin...

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Abstract

The invention discloses a method for detecting internal defects of a terahertz material based on a Gaussian iterative algorithm. Inverse Fourier transform from the domain to the time domain; add a gate function to the time domain signal reflected on the front and rear surfaces of the material to be tested; perform Fourier transform on the time domain of the signal processed by the gate function; solve the three-dimensional image function And a three-dimensional image is taken to reveal the internal defects of the material sample. The present invention aims at the active terahertz frequency modulation continuous wave scanning imaging system, focusing on the refraction and reflection of the terahertz wave inside the material, calculating the actual propagation path and loss of the terahertz wave through the Gaussian iterative algorithm, and using the improved distance offset The algorithm reconstructs the three-dimensional image distribution of the target, so as to realize the purpose of using terahertz waves to detect internal defects in materials.

Description

technical field [0001] The invention relates to the technical field of detection, in particular to a method for detecting internal defects of terahertz materials based on a Gaussian iterative algorithm. Background technique [0002] Terahertz three-dimensional holographic imaging technology has the advantages of high spatial resolution, strong anti-interference ability, and strong penetrating ability. It can be applied to the fields of composite material inspection, stealth coating material inspection, and internal defect inspection of heat insulation materials. The traditional terahertz imaging system has a complex structure, adopts the principle of lens focusing, and does not consider the path refraction of electromagnetic waves in the algorithm inversion process, which is very unfavorable for improving the detection accuracy of internal defects in materials. [0003] In the prior art, the active terahertz frequency-modulated continuous wave scanning imaging system is used...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/3586G01N21/95
CPCG01N21/3586G01N21/95
Inventor 胡大海王亚海
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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