Drain leakage current testing circuit and method in field effect transistor breakdown voltage characteristic
A field effect transistor and breakdown voltage technology, applied in the direction of testing dielectric strength, measuring electricity, measuring devices, etc., can solve the problems of high price, inability to guarantee measurement accuracy, non-compliance, etc., to save hardware costs and improve test accuracy. And the effect of high efficiency and high test accuracy
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[0030] Example 1:
[0031] A drain leakage current test circuit in the breakdown voltage characteristic of a field effect tube, such as image 3 As shown, the drain leakage current test circuit includes a test voltage source 1 and a tested field effect transistor 2. The test voltage source is used to apply voltage to the drain D and source S of the tested field effect transistor. A current / voltage conversion and amplifying module 3 is arranged between the positive electrode of the voltage source 1 and the drain D of the field effect tube. The voltage output signal of the current / voltage conversion and amplifying module is transmitted to the signal input terminal of an isolation amplifier module 4. The current / Voltage conversion and amplification module is obtained by the operational amplifier to obtain the sampling resistance signal to form current / voltage conversion. The isolated output end of the isolation amplifier module is connected to a microprocessor unit 5, which isolates...
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[0039] Example 2:
[0040] A drain leakage current test method in the breakdown voltage characteristic of a field effect tube is based on the test method of the drain leakage current test circuit of Embodiment 1. Therefore, the content of Embodiment 1 should be the content of this embodiment. Therefore, the test circuit includes a test voltage source and a field effect tube under test. The test voltage source is used to apply voltage to the drain D and source S of the field effect tube under test. A current / voltage conversion amplifying module is arranged between pole D, and the voltage output signal of the current / voltage conversion amplifying module is transmitted to the input end of an isolation amplifier module. The current / voltage conversion amplifying module is composed of an operational amplifier and a sampling resistor, The isolation output end of the isolation amplifier module is connected to a microprocessor unit, and the test voltage source output voltage of the rated ...
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