Test method of quantum chip
A testing method and chip testing technology, which is applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve the problems of not being able to apply quantum chip testing, time-consuming and energy-consuming, shoulder peak insensitivity, etc., and achieve fast calculation efficiency and oscillation The effect of high frequency and high accuracy
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[0055] In combination with the above method, the complete technical scheme of the present invention is as follows: figure 2 , 3 shown.
[0056] This program combines the random walk algorithm and the simulated annealing algorithm, and sets the threshold to collect and confirm the data of the valley bottom data of the oscillation waveform of the overall quantum chip test. First, a set of random decimals random1 between 0 and 1 is generated, and a Set a random integer random2, then start random walk, and set the threshold through the simulated annealing algorithm to obtain the bottom data of the oscillation waveform graph of the quantum chip test, the specific method is as follows:
[0057] First generate a set of random decimal numbers random1 between 0 and 1, and a set of random integers random2. Then start the whole process of random walking. The waveform is composed of a set of point sequences with horizontal and vertical coordinates. The oscillating waveform diagram test...
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