Dynamic parameter testing system for ADC unit of digital-analog hybrid micro-system

Abstract

The invention relates to a dynamic parameter testing system for an ADC unit of a digital-analog hybrid micro-system, which comprises an upper computer and a test board, wherein the upper computer is responsible for displaying and storing a test result; the test board comprises a signal generation module, a signal conditioning module, a clock generation module, a micro-system ADC unit and a micro-system FPGA unit; the test board is responsible for generating an input signal of the micro-system ADC unit and a sampling clock, completing collection, storage and processing for output data of the ADC unit and finally obtaining main dynamic performance parameters of the micro-system ADC unit. The dynamic parameter testing system makes full use of the high-speed data processing ability of the FPGAunit integrated inside the micro-system, performs collection, storage and processing on the sampling output data of the micro-system ADC unit through the micro-system FPGA unit and reduces the overhead of additional data transmission and the interference between signals. The dynamic parameter testing system can perform reliable and accurate testing on the dynamic parameters of the ADC unit of thedigital-analog hybrid micro-system.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a dynamic parameter testing system for an ADC unit of a digital-analog hybrid microsystem. Background technique [0002] With the increasing demand for miniaturization, low power consumption and high reliability of weaponry, space systems and aircraft, the architecture of discrete circuits individually packaged and then board-level interconnection cannot meet the small size and high precision requirements of the new generation of aerospace systems. , high density, and high reliability requirements. The digital-analog hybrid microsystem integrating functions such as ADC, DAC and FPGA has become a development trend in this field. With the increase of packaging integration density, the accessibility of internal nodes of microsystems decreases, and how to realize the test of internal chips with high coverage after microsystem integration becomes a difficult problem. The AD...

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Problems solved by technology

[0003] The existing patents mainly include: (1) A SoPC-based high-performance pipeline ADC frequency domain parameter evaluation system, application number: 201610225902.4, publication number: CN105808405A, the data collected by the ADC in this patent needs to be uploaded to the host computer for analysis through the serial port (2) The test system for the test accuracy of ADC chip characteristic parameters, application number: 201510107533.4, publication number: CN104734710A, in this patent, the ADC output terminal is connected with special ATE test equipment, and the test The system is expensive and bulky, and the test operation is difficult

[0004] In short, the existing patents have not yet carried out the research on the dynamic parameter testing of the ADC unit of the digital-analog hybrid microsystem, and most of the ADC sampling data are analyzed and processed by the host computer or ATE equipment. The FPGA unit provides a high-performance digital-analog hybrid microsystem ADC unit dynamic parameter test system

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