An integrated atomic force microscope probe preservation, transportation and cleaning device

Abstract

The invention belongs to the field of storage and cleaning of atomic force microscope probes and in particular relates to an integrated atomic force microscope probe storing, transporting and cleaningdevice. The integrated atomic force microscope probe storing, transporting and cleaning device is composed of probe mounting units, a final assembly box and a cleaning module. Probes are mounted andfixed in slots of gel fixture blocks by means of gel locking strips in a magnetic adsorption manner, and the gel fixture blocks fix the probes and are mounted in unit frames to form the probe mountingunits. The probe mounting units are parallelly placed in the final assembly box in lines and rows for convenience of storing and transporting the probes. The probes are fixed to the gel fixture blocks through the gel locking strips and the gel locking strips lock two sides of probe pedestals. The probes can be mounted through the easily clamped gel clamping strips, so that the probability that the probes which are mounted are damaged is avoided. The probe mounting units can be placed in the center of the cleaning module, the probes are cleaned ultrasonically, and protecting slots are formed in the gel locking blocks to protect cantilevers of the probes, so that the cleaning quality is improved and the safety is ensured. The integrated atomic force microscope probe storing, transporting and cleaning device has the characteristics of being high in safety, high in universality and convenient and efficient.

Description

technical field [0001] The invention belongs to the field of preservation and cleaning of atomic force microscope probes, and specifically relates to an integrated atomic force microscope probe preservation, transportation and cleaning device. Background technique [0002] AFM has been widely used due to its advantages of easy operation, simple sample preparation, and high resolution, and has become a necessary precision instrument in the fields of nanoscience and micro-nano processing. Since the tip of the probe used in the atomic force microscope is only a few atoms, and its cantilever is only a few microns, it is easy to be damaged during storage and transportation, and each probe is about tens of dollars. Reasonable storage and transportation methods need further research. Complete. As described in the EP2237051 patent, a liquid-tight container for storing and transporting atomic force microscope probes is provided with convex grooves for fixing the probes, and the conv...

AI Technical Summary

Problems solved by technology

Although this method uses low-frequency cleaning, there is no special protection for the cantilever, and it will still cause damage to the probe during cleaning, resulting in a decrease in its measurement accuracy

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