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SAR ADC-based calibration method and SAR ADC system

A calibration method and LMS algorithm technology, applied in signal transmission system, electrical signal transmission system, analog/digital conversion calibration/testing, etc., can solve the problems of slow calibration speed, failure to meet requirements, high chip cost, etc.

Active Publication Date: 2018-12-11
SANECHIPS TECH CO LTD
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  • Claims
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AI Technical Summary

Problems solved by technology

[0005] However, currently SAR ADCs with high calibration accuracy and fast calibration speed are difficult to integrate on-chip
The on-chip integrated SAR ADC calibrated by LMS algorithm has the following defects: 1. The calibration accuracy is low, which cannot meet the design requirements of high-precision SAR ADC; 2. The calibration speed is slow, which cannot meet the requirements of system-level applications for high-precision SAR ADC. Requirements; 3. The calibration scheme is complex and requires an additional calibration module, which makes the entire SAR ADC have a large area, high power consumption, long design cycle, and high chip cost
[0006] For the SAR ADC calibrated by the LMS algorithm in the related art, either the calibration speed is slow, the accuracy is not high, the scheme is complicated, or the technical problems cannot be integrated on the chip, and no effective solution has been proposed so far.

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Embodiment Construction

[0056] In order to make the purpose, technical solution and advantages of the present invention more clear, the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined arbitrarily with each other.

[0057] The steps shown in the flowcharts of the figures may be performed in a computer system, such as a set of computer-executable instructions. Also, although a logical order is shown in the flowcharts, in some cases the steps shown or described may be performed in an order different from that shown or described herein.

[0058] For the SAR ADC calibrated by the LMS algorithm, either the calibration speed is slow, the accuracy is not high, the scheme is complicated, or the technical problems cannot be integrated on the chip. This application chooses an LMS algorithm, optimi...

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Abstract

The invention discloses an SAR ADC-based calibration method and an SAR ADC system. The method comprises the following steps: sampling the same input signal twice, and superposing disturbance signals opposite in direction on the same input signals sampled twice to obtain two quantitative results; and subtracting the two quantitative results in a numeric field, and adjusting weight value of each bitcapacitor in a capacitor array through a least mean square (LMS) algorithm to drive error to approach 0. The method is not only fast in calibration speed and high in precision, but also can realize on-chip integration.

Description

technical field [0001] The invention relates to the field of integrated circuit design, in particular to a SAR ADC-based calibration method and a SAR ADC system. Background technique [0002] With the continuous development of integrated circuits, analog-to-digital converters are gradually developing in the direction of high speed, high precision, low power consumption, and small area. In many systems, the accuracy requirements for analog-to-digital converters are generally around 12 to 14 bits. Factors such as errors seriously affect the performance of the analog-to-digital converter. If it is not calibrated, the accuracy of the analog-to-digital converter is generally limited to about 10 bits, which is difficult to meet the application requirements. In practical applications, A / D converters mostly use calibration techniques to correct the impact of various errors on their performance. [0003] Calibration techniques in analog-to-digital converters generally fall into tw...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10H03M1/46
CPCH03M1/1014H03M1/466
Inventor 李艳辉郑宇亮
Owner SANECHIPS TECH CO LTD
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