Time sequence and waveform generation device and method
A waveform generation and timing generator technology, applied in the direction of measuring devices, instruments, measuring electronics, etc., can solve the problems that digital IC function test application scenarios are not suitable and digital ICs are not available, so as to achieve flexible timing control and reduce test errors , Improve the effect of test accuracy
Pending Publication Date: 2019-01-04
武汉精鸿电子技术有限公司
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Problems solved by technology
There are many domestic patents on the method of generating high-precision programmable pulse signals, but they are not suitable for digital IC function test application scenarios.
However, there are basically no patents on digital IC function test timing and waveform generation methods.
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[0037] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0038] The system block diagram of timing and waveform generating device in the function test of the present invention is as follows: figure 1 As shown, a vector generator, multiple groups of timing and waveform processing units; wherein, each group of timing and waveform processing units is composed of a timing generator and a waveform controller; the vector generators are respectively connected to multiple groups of timing generators; The timing generator is...
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The invention provides a time sequence and waveform generation device and method. The device includes a vector generator and multiple sets of time sequence and waveform processing units, wherein eachset of time sequence and waveform processing units is composed of a time sequence generator and a waveform controller, the vector generator is connected with the multiple sets of time sequence generators, the time sequence generators are connected with the waveform controllers, the vector generator is used for providing test vectors and the time sequence information, the time sequence generators are used for generating a timing edge based on the time sequence information, and the waveform controllers are used for converting the test vectors into waveform signals according to the timing edge. The method is advantaged in that the timing edge signals are distributed to sub-processing unit code patterns by distributors in the waveform controllers, waveforms are generated by the test vectors received by code pattern formatters in the waveform controllers according to the timing edge signals corresponding to code pattern selection, and a problem of low output time sequence precision of an automatic test device is solved.
Description
technical field [0001] The invention relates to the field of digital integrated circuit testing, in particular to a timing and waveform generating device and method. Background technique [0002] Integrated Circuits (Integrated Circuits, IC), according to their different functions and structures, can be divided into three categories: analog integrated circuits, digital integrated circuits and hybrid integrated circuits. Digital integrated circuits have the advantages of small size, low power consumption, high reliability, low cost and easy to use. It has been widely used in the fields of automatic control, measuring instruments, communications and electronic computers. [0003] IC testing is an important part of the integrated circuit industry and one of the key links to ensure the performance and quality of integrated circuits. Digital IC functional testing is used to ensure that the test device can perform its intended function correctly. In order to achieve the purpose...
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IPC IPC(8): G01R31/3185
CPCG01R31/318522
Inventor 孟杨邓标华
Owner 武汉精鸿电子技术有限公司