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Dual-band thermal imaging method and device with partially overlapping multi-aperture fields of view

A dual-band, multi-aperture technology, applied in measuring devices, radiation pyrometry, optical radiation measurement, etc., can solve the problem of single-aperture imaging without optical parallel processing, lack of self-detection, tracking and judgment capabilities, and lack of monocular vision Space positioning, fast tracking and other issues of moving targets, to achieve the effect of accurate detection of small targets

Active Publication Date: 2020-10-13
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Multi-aperture imaging technology is a new imaging mode that is currently developing rapidly, and it is expected to solve or slow down many problems of traditional single-aperture thermal imaging: 1) The contradiction between large field of view and high resolution; 2) The miniaturization of diffraction-limited systems; 3 )Single-aperture imaging does not take advantage of optical parallel processing; 4) The problem of losing three-dimensional information of the scene during the imaging process; 5) Lack of self-detection, tracking and judgment capabilities of biological vision for moving objects
At present, most of the artificial photoelectric imaging systems are monocular systems. Not only are the limited detector arrays evenly distributed in the field of view, resulting in the mutual limitation of the imaging field of view and resolution, but also the monocular vision lacks intelligent features such as spatial positioning and fast tracking of moving targets.

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  • Dual-band thermal imaging method and device with partially overlapping multi-aperture fields of view
  • Dual-band thermal imaging method and device with partially overlapping multi-aperture fields of view
  • Dual-band thermal imaging method and device with partially overlapping multi-aperture fields of view

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Embodiment Construction

[0019] The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0020] The invention provides a dual-band thermal imaging method and device with partially overlapping multi-aperture fields of view, which combines thermal imaging with partially overlapping multi-aperture fields of view and dual-band image fusion, and designs a dual-band thermal imaging method with partially overlapping multi-aperture fields of view. The imaging method and device realize large field of view, high resolution, dual-band thermal imaging fusion, make full use of the complementarity and richness of multi-eye and multi-band information, improve target detection, fast tracking and identification capabilities, especially solve the problem of small targets with complex backgrounds Probing puzzles.

[0021] The dual-band thermal imaging device with partially overlapping multi-aperture fields of view of the present invention includes multiple group...

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Abstract

The invention discloses a multi-aperture view field partially overlapped dual-waveband thermal imaging method and device, which can realize the complementarity and enrichment of large view field, highresolution, multi-view and multi-band information, and improve the target detection, fast tracking and recognition capabilities. The device comprises multiple groups of single-aperture infrared imaging detector assemblies, wherein view fields of the adjacent single-aperture infrared imaging detector assemblies are overlapped; and the infrared imaging detector assemblies comprise long-wave detector assemblies and medium-wave detector assemblies, wherein the long-wave detector assemblies and the medium-wave detector assemblies are arranged at intervals, and the detector assemblies of the same kind are distributed in a centrosymmetric manner. The more the detectors overlapped in a view field overlapping region are, the higher the resolution of the region is; and in addition, the overlappingregion can simultaneously obtain long-wave imaging data and medium-wave imaging data, the complementarity and enrichment of the multi-waveband information can be fully utilized, and the target detection, fast tracking and recognizing capabilities can be improved.

Description

technical field [0001] The invention belongs to the technical field of photoelectric detection and image processing, and in particular relates to a dual-band thermal imaging method and device with partially overlapping multi-aperture fields of view. Background technique [0002] Infrared thermal imaging is a key technology that is currently under development at home and abroad. Infrared medium wave and long wave have different radiation characteristics, and their information has complementary and joint functions. Infrared medium-wave and long-wave radiation are different in high and low temperature regions. Due to the difference between the target and the background, the difference in the medium wave radiation is greater than that of the long wave, and the hot target is more prominent in the medium wave. Long-wave is more sensitive to medium and low temperature targets, and high-temperature targets are more obvious in medium-wave images. The fusion of infrared mid-wave an...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/00G01J5/10
CPCG01J5/00G01J5/10G01J2005/0077G01J2005/106
Inventor 金伟其李力罗琳王霞米凤文
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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