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Measuring method and measuring device for photometric and chromatic parameters of micro-region of light-emitting device

A technology of light-emitting device and measurement method, which is applied in the direction of measurement device, machine/structural component test, optical instrument test, etc., to achieve the effect of fast and comprehensive detection of light-emitting quality

Active Publication Date: 2019-11-08
XIAMEN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the above-mentioned problems in the prior art, to provide a method for measuring the photometric and chromatic parameters of the micro-region of the light-emitting device and a measuring device thereof, so as to solve the problem of two-dimensional surface photometry and chromaticity of the light-emitting device or the micro-display array. and uniformity measurement and analysis problems, quickly and comprehensively detect the luminous quality of the device

Method used

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  • Measuring method and measuring device for photometric and chromatic parameters of micro-region of light-emitting device
  • Measuring method and measuring device for photometric and chromatic parameters of micro-region of light-emitting device
  • Measuring method and measuring device for photometric and chromatic parameters of micro-region of light-emitting device

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Experimental program
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Effect test

Embodiment 1

[0046] Embodiment 1: OLED sample

[0047] Step 1. Collect hyperspectral data of the sample OLED to be tested. Firstly, put the OLED sample to be tested on figure 2 On the temperature-controlled heat sink 9 of the stage of the microscope 7 shown, the sample 8 is connected to the driving power supply 10, and the temperature of the temperature-controlled heat sink 9 is adjusted through the temperature-controlled power supply 11 to ensure that the temperature of the sample remains constant. Select an objective lens with a suitable magnification, turn on the hyperspectral imager 6, and adjust the focal length of the microscope 7 to focus on the surface of the OLED sample. The sample is not lit first, and the spectral information D(λ) under dark current is collected by the hyperspectral imager 6, and then the OLED is lit to collect the photon number spectrum P(λ) of the OLED sample under different driving conditions.

[0048] Step 2. Perform data analysis and calculation. First,...

Embodiment 2

[0061] Example 2: micro-LED sample

[0062] Step 1. Collect hyperspectral data of the test sample micro-LED. First put the micro-LED sample to be tested in figure 2 On the temperature-controlled heat sink 9 of the stage of the microscope 7 shown in the system, the sample 8 is connected to the driving power supply 10, and the temperature of the temperature-controlled heat sink 9 is adjusted through the temperature-controlled power supply 11 to ensure that the temperature of the sample remains constant. Select an objective lens with a suitable magnification, turn on the hyperspectral imager 6, and adjust the focal length of the microscope 7 to focus on the surface of the micro-LED sample. Without lighting up the sample, the spectral information D(λ) under dark current is collected by the hyperspectral imager 6 . Then turn on the micro-LED, and collect the photon number spectrum P(λ) of the micro-LED sample under different driving conditions.

[0063] Step 2. Import the colle...

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Abstract

The invention discloses a measuring method and measuring device for photometric and colorimetric parameters of a micro region of a luminescent device, and relates to the field of measurement of the photometric and colorimetric parameters of the luminescent device. The measuring device for the photometric and colorimetric parameters of the micro region of the luminescent device comprises a radiancelight source calibration system and a microscopic hyperspectral imaging test system; and the radiance light source calibration system comprises a spectrometer, a spectral radiance probe, an integrating sphere and a halogen tungsten lamp light source; the microscopic hyperspectral imaging test system comprises a hyperspectral imager, a microscope, a temperature control power supply and a driving power supply. The measuring method comprises the following steps: firstly, acquiring a spectral radiance distribution calibration file of a uniform luminous plane, then calibrating the microscopic hyperspectral imaging test system, and finally testing and calculating the photometric and colorimetric parameters of a sample to be measured. The measuring method and the measuring device can solve the problems on measurement and analysis of the photometry, the colorimetry and the uniformity of a two-dimensional surface of the luminescent device or a microdisplay array, and quickly and comprehesivelydetect the luminous quality of the device.

Description

technical field [0001] The invention relates to the field of measuring photometric and chromatic parameters of light-emitting devices, in particular to a method for measuring photometric and chromatic parameters of micro-regions of a light-emitting device based on hyperspectral imaging and a measuring device thereof. Background technique [0002] In various fields of information technology, light-emitting devices are everywhere in people's lives, constantly changing people's lifestyles, improving people's quality of life, and promoting the civilization and progress of human society. In particular, semiconductor lighting and display represented by semiconductor light-emitting devices (LED, OLED) is one of the most promising high-tech fields in the 21st century. Mobile phones, tablet computers, wearable devices, virtual reality (VR) and augmented reality (AR), etc., can meet the requirements of new display technology in terms of high resolution, high brightness, low power cons...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/00
CPCG01M11/00
Inventor 吕毅军郑莉莉阮育娇高玉琳周萍朱丽虹郭自泉林岳陈国龙陈忠
Owner XIAMEN UNIV